A grid procedure applied to the determination of parameters of a kinetic process

Isotani, Sadao; Fujii, Américo Tsuneo

doi:10.1016/s0010-4655(02)00692-6

Cited by 9 publications

(7 citation statements)

References 11 publications

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“…1(a), the rise in the substrate temperature is, even without electric heating of the substrate holder, due to the radiation from the evaporator and ion irradiation. All the spectra can be fit well using multiple Lorentzians [12,13] and the grid optimization method [14] and the results are shown in the figure. The spectrum in Fig.…”

Section: Methodsmentioning

confidence: 99%

Fourier transform infrared spectroscopy analysis of thin boron nitride films prepared by ion beam assisted deposition

Matsuoka

Langhi

Isotani

et al. 2014

Phys. Status Solidi C

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Thin boron nitride (BN) films were synthesized by ion beam assisted deposition (IBAD). From Fourier transform infrared spectroscopy (FTIR) analysis results, it was found that: the films with the co‐presence of explosion‐phase BN (E‐BN) and sp2‐bonded hexagonal BN (h‐BN), and those with pure h‐BN were formed in the respective substrate temperature regions of 20–85 °C and 350–400 °C, under nitrogen ion irradiation (ion energy from 500 to 1000 eV), while the substrate temperature at 400 °C and mixed nitrogen and argon ion irradiation were necessary for the formation of sp3‐bonded cubic BN (c‐BN). To our knowledge, the E‐BN phase was formed firstly by IBAD in this study. The crystalline phase identification through the FTIR results was in line with X‐ray diffraction results. The shift of the c‐BN peak position is usually attributed to remaining compressive stress in the film. In this work, the downward shift of the c‐BN peak position and the broadening of the c‐BN peak, which were observed when the film thickness increased, can be interpreted using a phenomenological description of structural disordering in the c‐BN sites. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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Section: Methodsmentioning

confidence: 99%

Fourier transform infrared spectroscopy analysis of thin boron nitride films prepared by ion beam assisted deposition

Matsuoka

Langhi

Isotani

et al. 2014

Phys. Status Solidi C

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“…The parameters of these lines were determined through a spectral decomposition analysis of the optical absorption in the visible and ultraviolet regions. The topaz samples were submitted to irradiation and heat treatment at 200 • C and 600 • C. The parameters of these decompositions were refined using the optimization method reported by Isotani and Fujii [26]. Also, in this paper we report an analysis of the dependence of transmittance, color purity and dominant wavelength with thickness.…”

Section: Advances In Condensed Matter Physicsmentioning

confidence: 99%

“…The parameters of (6), ν 0i , Δν i , and a i , were determined using a grid optimization method [26]. This method was applied to optimize the decomposition of the spectra of spodumene [15] and beryl [10].…”

Section: The 1931 Cie Chromaticity Diagram Calculationsmentioning

confidence: 99%

Color Dependence on Thickness in Topaz Crystal from Brazil

Bonventi

Isotani

Albuquerque

2012

Advances in Condensed Matter Physics

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It is well known that crystals of topaz from the Eastern Brazilian Pegmatite Province may turn blue by the irradiation with 60 Co gamma rays followed by heat treatment. Also, it is known that the sensation of color changes with the thickness of these crystals. The dependence of the color, given by 1931 CIE chromaticity coordinates, with the thickness of the crystal was analyzed. The absorbance used in the calculation of these coordinates was given by the sum of Gaussian lines. The parameters of these lines were determined through the decomposition of the optical absorption spectra in the ultraviolet and visible regions. The decomposition revealed several lines, whose assignment was made considering studies in spodumene and beryl crystals and highly accurate quantum mechanical calculations. The transmittance becomes very narrow with increasing thickness, and the CIE chromaticity coordinates converge to the borderline of the CIE Chromaticity Diagram at the wavelength of maximum transmittance. Furthermore, the purity of color increases with increasing thickness, and the dominant wavelength reaches the wavelength of maximum transmittance.

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“…Our study includes fitting of C 1s and N 1s XPS spectra with the Doniach-Šunjić function which has been widely used for peak fitting [21], using the fitting procedure described elsewhere [22]. The fit parameters were optimized with a grid method [23] and the deviations due to the fitting procedure were obtained as follows. Varying each parameter to higher and lower values than its bestfit parameter value, the corresponding cost functions were calculated.…”

Section: Methodsmentioning

confidence: 99%

X-Ray Photoelectron Spectroscopy and Raman Spectroscopy Studies on Thin Carbon Nitride Films Deposited by Reactive RF Magnetron Sputtering

Matsuoka¹,

Isotani²,

Mansano³

et al. 2012

WJNSE

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Thin carbon nitride (CNx) films were synthesized on silicon substrates by reactive RF magnetron sputtering of a graphite target in mixed N2/Ar discharges and the N2 gas fraction in the discharge gas, F N, varied from 0.5 to 1.0. The atomic bonding configuration and chemical composition in the CNx films were examined using X-ray photoelectron spectroscopy (XPS) and the degree of structural disorder was studied using Raman spectroscopy. An increase in the nitrogen content in the film from 19 to 26 at% was observed at FN = 0.8 and found to influence the film properties; normality tests suggested that the data obtained at FN = 0.8 are not experimental errors. The interpretation of XPS spectra might not be always straightforward and hence the detailed and quantitative comparison of the XPS data with the information acquired by Raman spectroscopy enabled us to interpret the decomposed peaks in the N 1s and C 1s XPS spectra. Two N 1s XPS peaks at 398.3 and 399.8 eV (peaks N1 and N2, respectively) were assigned to a sum of pyridine-like nitrogen and -C≡N bond, and to a sum of pyrrole-like nitrogen and threefold nitrogen, respectively. Further, the peaks N1 and N2 were found to correlate with C 1s XPS peaks at 288.2 and 286.3 eV, respectively; the peak at 288.2 eV might include a contribution of sp3 carbon

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A grid procedure applied to the determination of parameters of a kinetic process

Cited by 9 publications

References 11 publications

Fourier transform infrared spectroscopy analysis of thin boron nitride films prepared by ion beam assisted deposition

Fourier transform infrared spectroscopy analysis of thin boron nitride films prepared by ion beam assisted deposition

Color Dependence on Thickness in Topaz Crystal from Brazil

X-Ray Photoelectron Spectroscopy and Raman Spectroscopy Studies on Thin Carbon Nitride Films Deposited by Reactive RF Magnetron Sputtering

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