1976
DOI: 10.1126/science.193.4259.1242
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A Hexagonal (Wurtzite) Form of Silicon

Abstract: The existence of a hexagonal (wurtzite) form of silicon, similar to that form of diamond (carbon) observed in meteorites and in the laboratory, has been identified by x-ray diffraction in reaction-bonded silicon nitride containing unreacted silicon. The presence of this phase is due to stresses created in the silicon by the nitridation reaction.

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Cited by 35 publications
(22 citation statements)
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“…This is particularly true for group IV based materials for which the existence of phases other than the cubic-diamond cannot be achieved in standard conditions. [6][7][8] Nevertheless, in group IV nanowires, the stability of novel polytypes -previously theoretically predicted 9 but experimentally observed only very locally in the form of crystal imperfections [10][11][12][13] is now supported by clear experimental evidences. [14][15][16][17][18][19] For instance, Vincent et al 14 reported the synthesis of quasi-periodic allotrope Ge heterostructures of hexagonal-diamond (wurtzite structure with single atom type) and cubic-diamond domains.…”
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confidence: 90%
“…This is particularly true for group IV based materials for which the existence of phases other than the cubic-diamond cannot be achieved in standard conditions. [6][7][8] Nevertheless, in group IV nanowires, the stability of novel polytypes -previously theoretically predicted 9 but experimentally observed only very locally in the form of crystal imperfections [10][11][12][13] is now supported by clear experimental evidences. [14][15][16][17][18][19] For instance, Vincent et al 14 reported the synthesis of quasi-periodic allotrope Ge heterostructures of hexagonal-diamond (wurtzite structure with single atom type) and cubic-diamond domains.…”
mentioning
confidence: 90%
“…As will be explained below, this type of Si polymorph has been observed in Si submitted to nanoindentation experiments and in nanoparticles nucleated in the gas phase. [8][9][10] Interestingly, two slightly different Si IV structures were observed (see Table 1 for the crystallographic parameters): Si IV A [11] and Si IV B , [12] with 22 % and 78 % of the total NW amount, respectively. However, on NWs with a radius below 10 nm (which in fact represents less than 10 % of the total amount in our samples) we found 44 % of Si I, 44 % of Si IV B , and 12 % of Si IV A NWs.…”
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confidence: 95%
“…In contrast, an error of less than 5 % was obtained when using a crystalline structure similar to the one observed by Jennings and Richman (Si IV B ). [12] The lattice parameters differ from the other wurtzite polymorph Si IV A , for which the calculated fitting errors were greater than 11 %. The c/a ratio in the Si IV B structure is 1.63, which is exactly the same as the c/a ratio reported for a similar form of carbon.…”
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confidence: 98%
“…Prudent approaches should be taken when analyzing nanostructured Si, however, particularly for chemically synthesized samples. In addition to the lattice-fringe-resolved high-resolution (HR) images, the diffraction pattern must be examined with caution using a calibrated camera length, as the difference between various polymorphs can be easily overlooked [4,5,9]. The following discussion pertains to SiNWs prepared by the vapor-liquid-solid (VLS) mechenism, evidenced in Figs.…”
Section: Hrtem Characterization Of Diamond and Wurtzite Sinwsmentioning
confidence: 99%