2024
DOI: 10.3390/instruments8010019
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A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs

James B. Rosenzweig,
Gerard Andonian,
Ronald Agustsson
et al.

Abstract: Recently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and state-of-the-art concepts in beam dynamics, magnetic undulators, and X-ray optics. A full conceptual design of a 1 nm (1.24 keV) UCXFEL with a length and cost over an order of magnitude below current X-ray free-electron lasers (XFELs) has resulted from this ef… Show more

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