Conference Record of the 1991 International Display Research Conference
DOI: 10.1109/displ.1991.167481
|View full text |Cite
|
Sign up to set email alerts
|

A high image-quality LCD addressed by lateral MIM

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
6
0

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(6 citation statements)
references
References 1 publication
0
6
0
Order By: Relevance
“…This is precisely why manufacturers invested in MIM-TFD technology throughout the 1990s. 7,8 Single-select MIM-TFD technologies struggled with poor gray-scale control and large-area uniformity issues so that they could not compete with a-Si:H TFT backplane technology. The uniformity issues can be solved by moving to a dual-select drive circuit.…”
Section: Introducing the Amorphous-metal Non-linear Resistormentioning
confidence: 99%
See 4 more Smart Citations
“…This is precisely why manufacturers invested in MIM-TFD technology throughout the 1990s. 7,8 Single-select MIM-TFD technologies struggled with poor gray-scale control and large-area uniformity issues so that they could not compete with a-Si:H TFT backplane technology. The uniformity issues can be solved by moving to a dual-select drive circuit.…”
Section: Introducing the Amorphous-metal Non-linear Resistormentioning
confidence: 99%
“…Reduced mask count and process simplicity can potentially have a tremendous impact on device yield and cost. This is precisely why manufacturers invested in MIM‐TFD technology throughout the 1990s 7 , 8 . Single‐select MIM‐TFD technologies struggled with poor gray‐scale control and large‐area uniformity issues so that they could not compete with a‐Si:H TFT backplane technology.…”
Section: Introducing the Amorphous‐metal Non‐linear Resistormentioning
confidence: 99%
See 3 more Smart Citations