A high resolution crystal diffraction spectrometer for X-ray analysis

The Dresden EBIT, a source of highly charged ions, is based on electron impact ionization of primarily neutral atoms in a high‐density electron beam. Inside the source x‐radiation originates from direct excitation, radiative recombination and dielectronic recombination processes. Since the energy of the exciting electrons is tunable, specific atomic states can be prepared for particular investigations. The intensity of the x‐ray flux allows the realization of energy‐ and wavelength‐dispersive x‐ray spectrometry of highly charged ions. Spectra of helium‐ and hydrogen‐like titanium and zinc ions are shown as examples. Copyright © 2004 John Wiley & Sons, Ltd.

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The Dresden EBIT: a novel source of x‐rays from highly charged ions

Kentsch

Landgraf

Zschornack

et al. 2004

X-Ray Spectrometry

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High resolution wavelength dispersive X-ray spectroscopy for ECR plasma diagnostics

1996

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Production of bare argon, manganese, iron and nickel nuclei in the Dresden EBIT

Kentsch

Zschornack

Großmann

et al. 2002

Nuclear Instruments and Methods in Physics Research Section B:

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A high resolution crystal diffraction spectrometer for X-ray analysis

Cited by 8 publications

References 6 publications

The Dresden EBIT: a novel source of x‐rays from highly charged ions

The Dresden EBIT: a novel source of x‐rays from highly charged ions

High resolution wavelength dispersive X-ray spectroscopy for ECR plasma diagnostics

Production of bare argon, manganese, iron and nickel nuclei in the Dresden EBIT

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