A high sensitivity temperature coefficient of the Au/n-Si with (CdTe-PVA) structure based on capacitance/conductance-voltage (C/G-V) measurements in a wide range of temperature

Erbilen Tanrıkulu, Esra; Güçlü, Çiğdem Şükriye; Altındal, Şemsettin; Durmuş, Haziret

doi:10.1016/j.measurement.2024.115316

Measurement

2024

DOI: 10.1016/j.measurement.2024.115316

|View full text |Cite

A high sensitivity temperature coefficient of the Au/n-Si with (CdTe-PVA) structure based on capacitance/conductance-voltage (C/G-V) measurements in a wide range of temperature

Esra Erbilen Tanrıkulu,

Çiğdem Şükriye Güçlü,

Şemsettin Altındal

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 58 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

The dielectric characteristics of spray deposited α-Si3N4:ZnO thin films: The nitride effect on frequency-dependent capacitance and conductance profiles

İbrahimoğlu,

Demir,

Çalışkan

et al. 2024

Solid State Sciences

View full text Add to dashboard Cite

The dielectric characteristics of spray deposited α-Si3N4:ZnO thin films: The nitride effect on frequency-dependent capacitance and conductance profiles

İbrahimoğlu,

Demir,

Çalışkan

et al. 2024

Solid State Sciences

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

A high sensitivity temperature coefficient of the Au/n-Si with (CdTe-PVA) structure based on capacitance/conductance-voltage (C/G-V) measurements in a wide range of temperature

Cited by 1 publication

References 58 publications

The dielectric characteristics of spray deposited α-Si3N4:ZnO thin films: The nitride effect on frequency-dependent capacitance and conductance profiles

The dielectric characteristics of spray deposited α-Si3N4:ZnO thin films: The nitride effect on frequency-dependent capacitance and conductance profiles

Contact Info

Product

Resources

About