2019
DOI: 10.1016/j.jallcom.2019.03.214
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A highly-efficient approach for reducing phase transition temperature of VO2 polycrystalline thin films through Ru4+-doping

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Cited by 31 publications
(22 citation statements)
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“…Also, it is worth noting that V 5+ ions are probed by XPS while there are no characteristic peaks of the V 2 O 5 phase in XRD patterns. Considering that XPS is a surfacesensitive technique and the XRD analysis reveals the lattice structure of the whole sample, the presence of V 5+ ions is believed to be derived from surface oxidation during storage and it exists only on the surface of samples as reported previously [24][25][26][27] . Figure 2 b further shows the close-up views of (011) peak for all the samples after fitting with Lorentzian function.…”
Section: High-concentration Ti Was Introduced Intomentioning
confidence: 73%
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“…Also, it is worth noting that V 5+ ions are probed by XPS while there are no characteristic peaks of the V 2 O 5 phase in XRD patterns. Considering that XPS is a surfacesensitive technique and the XRD analysis reveals the lattice structure of the whole sample, the presence of V 5+ ions is believed to be derived from surface oxidation during storage and it exists only on the surface of samples as reported previously [24][25][26][27] . Figure 2 b further shows the close-up views of (011) peak for all the samples after fitting with Lorentzian function.…”
Section: High-concentration Ti Was Introduced Intomentioning
confidence: 73%
“…For all the films, the (011) peak seems to be of higher intensity than the other peaks, revealing a preferential growth along (011) facet. No diffraction peaks from other vanadium oxide ( [22] or titanium/ruthenium oxide phases can be detected [24]. Also, it is worth noting that V 5+ ions are probed by XPS while there are no characteristic peaks of the V 2 O 5 phase in XRD patterns.…”
Section: High-concentration Ti Was Introduced Intomentioning
confidence: 99%
See 3 more Smart Citations