2015
DOI: 10.1109/jmems.2015.2416231
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A Highly Reliable Two-Axis MEMS Relay Demonstrating a Novel Contact Refresh Method

Abstract: This paper reports on a two-axis actuated microelectromechanical systems (MEMS) relay to realize a unique contact-refresh concept. In comparison with all other conventional MEMS relays utilizing only several designated contact spots during their whole lifetime, the proposed concept can change the real contact spots (asperities) by altering the lateral position of contact asperities, thus providing highly reliable contact endurance. In addition, it can enhance lifetime of the switches that fail by contact resis… Show more

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Cited by 17 publications
(12 citation statements)
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“…Conventionally, operation voltage and reliability for industrial applications need to be reduced to 1 V or less and to be extended to more than 1 billion cycles, respectively, while current M/NEM switches still show operational voltage of ≈10 and stable cyclic operations only in the millions of iterations 14,212,214. To improve the operational voltage and reliability issues, diverse approaches exploiting material, structural, and circuit aspects have been actively studied 224–231. In particular, recent advances in micro/nanofabrication have enabled researchers to achieve great progress in M/NEM switches using geometrically structured nanomaterials.…”
Section: High‐performance Nems/mems Devicesmentioning
confidence: 99%
See 1 more Smart Citation
“…Conventionally, operation voltage and reliability for industrial applications need to be reduced to 1 V or less and to be extended to more than 1 billion cycles, respectively, while current M/NEM switches still show operational voltage of ≈10 and stable cyclic operations only in the millions of iterations 14,212,214. To improve the operational voltage and reliability issues, diverse approaches exploiting material, structural, and circuit aspects have been actively studied 224–231. In particular, recent advances in micro/nanofabrication have enabled researchers to achieve great progress in M/NEM switches using geometrically structured nanomaterials.…”
Section: High‐performance Nems/mems Devicesmentioning
confidence: 99%
“…Although M/NEM switching devices have outstanding performance, such as quasi‐zero leakage current, low power consumption, high on/off characteristics, and the possibility of operation under harsh environmental conditions, such as high temperatures and external electrical and radiation exposure, they still suffer from unacceptably low reliability, hindering their use in practical applications and their further development. In general, failures of M/NEM switches can be classified into i) permanent stiction by contact material welding and melting during operation and ii) sudden electrical resistance increase due to wear and fracture at the contacting interfaces 14,224–227,229,231,249,265,266. To alleviate these failure issues and demonstrate long‐term reliability in M/NEM switches, various methods based on material, structural, and circuit approaches have been actively developed.…”
Section: High‐performance Nems/mems Devicesmentioning
confidence: 99%
“…However, the low elastic modulus, low melting point, and high ductility of Au lead to surface damages in the case of repeated contact loading, thus limiting the stable and repetitive operation of the switches . Recently, a broad range of materials and structural designs of the switches have been proposed to improve their lifetimes. For example, the switches based on metal alloys, ruthenium, or silicon carbide have shown improved contact lifetimes. Moreover, there have been studies about all metal-based NEM switches to improve the lifetime with a reduced contact resistance. , For example, Qian et al. reported studies about NEM switches fabricated by molybdenum (Mo) as contact material and structure by a single lithography step, and thus achieved a decreased contact resistance of several kiloohms even at the nanoscale contact area, which also showed repeatable operations at high temperature.…”
Section: Introductionmentioning
confidence: 99%
“…In general, the actual operation of M/NEM switching devices consists of "contact−separation" of a large number of atomicand nano-asperities at the contacting interface. 25,35 These contacting spots are too tiny to perform a specific analysis of nanoscale contact phenomena such as wear. The difficulty in manufacturing is another reason.…”
Section: Introductionmentioning
confidence: 99%