“…For the characterization of Cdots, XPS has generally been used for the assessment of the elemental composition and the chemical bonds of C-dots in combination with IR. Doping of C-dots with nonmetallic heteroatoms such as N [43,49,56,99,114,121,122,134], S [14,24,46,49,87], Si [50,127,140,141], P [39,49,93], and B [114,142] has been characterized by XPS. A typical example of XPS analysis employed to estimate the surface states and chemical composition of nitrogen and sulfur-codoped C-dots (SNCNs) was displayed in Figure 6 [46].…”