A large area CCD X-ray detector for exotic atom spectroscopy

Nelms, N.; Anagnostopoulos, D. F.; Ayranov, O.; Borchert, G.; Egger, J.‐P.; Gotta, D.; Hennebach, M.; Indelicato, P.; Leoni, B.; Liu, Yi-Wei; Manil, B.; Simons, L. M.; Wells, A.

doi:10.1016/s0168-9002(01)02051-4

Cited by 39 publications

(11 citation statements)

References 11 publications

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“…A spectrometer setup in Johann geometry, here with a spherically bent crystal, enabled the simultanuous measurement of an energy interval corresponding to the extension of x-ray source and detector along the direction of dispersion. Using as detector a 2 × 3 matrix of adjacent high-efficiency, low-noise CCDs of 24 × 24 mm 2 with 600 × 600 pixels each [30], the detector width of 48 mm covered completely the ECRIS collimator opening together with an almost complete overlap with the reflection in the vertical direction. Owing to its granularity, we achieved a full width at half maximum of about seven pixels for the M1 line.…”

Section: Figmentioning

confidence: 99%

High-accuracy x-ray line standards in the 3-keV region

et al. 2013

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A set of 14 high-accuracy x-ray transition energies in the 2.4-3.1 keV range is presented, which can be used as x-ray standards. They were measured in two-to four-electron sulfur, chlorine, and argon ions produced in an electron-cyclotron resonance ion source, using a single spherically bent crystal spectrometer. The results include the first measurement of six transitions and improve the accuracy of six other experimental values. These measurements considerably extend the set of high-accuracy x-ray energies reported for highly charged ions. Their relative uncertainties range from 1 to 10 ppm. Theory only reaches such a precision in one-and two-electron ions. Our results thus have two distinct applications. On the one hand, they test predictions in two-electron ions [Artemyev, Shabaev, Yerokhin, Plunien, and Soff, Phys. Rev. A 71, 062104 (2005)], at the precision level of some two-photon QED contributions. We observe an agreement with theory for most of the transitions. On the other hand, the three-and four-electron ion transitions provide new benchmark energies for the calculation of missing theoretical contributions, such as Auger shifts or electronic correlations. Spectra were analyzed with an x-ray tracing simulation that contains all the relevant physics of the spectrometer.

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Section: Figmentioning

confidence: 99%

High-accuracy x-ray line standards in the 3-keV region

et al. 2013

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“…For the simultaneous detection of the pionic and muonic atoms lines, the spectrometer has been equipped with a large position-sensitive detector, which is composed of an array of charge-coupled devices (CCDs) corresponding to a total sensitive area of about 48×72 mm 2 [43,44].…”

Section: X-ray Spectrometer and Data Acquisitionmentioning

confidence: 99%

Measurement of the charged pion mass using a low-density target of light atoms

et al. 2016

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Abstract. We present a new evaluation of the negatively charged pion mass based on the simultaneous spectroscopy of pionic nitrogen and muonic oxygen transitions using a gaseous target composed by a N 2 /O 2 mixture at 1.4 bar. We present the experimental set-up and the methods for deriving the pion mass value from the spatial separation from the 5g − 4 f πN transition line and the 5g − 4 f μO transition line used as reference. Moreover, we discuss the importance to use dilute targets in order to minimize the influence of additional spectral lines from the presence of remaining electrons during the radiative emission. The occurrence of possible satellite lines is investigated via hypothesis testing methods using the Bayes factor.

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“…The experimental setup was composed mainly of two parts: an ECR ion trap [11] and a Bragg spectrometer setup in Johann geometry [61,62]. The x rays reflected by the spectrometer crystal were recorded by a two-dimensional CCD camera [63] placed in the proximity of the Rowland circle of the spectrometer. Details about calibration and spectra construction can be found in Refs.…”

Section: Application To a Sulfur Plasmamentioning

confidence: 99%

X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

et al. 2010

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Analysis of x-ray spectra emitted by highly charged ions in an electron-cyclotron-resonance ion source (ECRIS) may be used as a tool to estimate the charge-state distribution (CSD) in the source plasma. For that purpose, knowledge of the electron energy distribution in the plasma, as well as the most important processes leading to the creation and de-excitation of ionic excited states are needed. In this work we present a method to estimate the ion CSD in an ECRIS through the analysis of the x-ray spectra emitted by the plasma. The method is applied to the analysis of a sulfur ECRIS plasma.

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A large area CCD X-ray detector for exotic atom spectroscopy

Cited by 39 publications

References 11 publications

High-accuracy x-ray line standards in the 3-keV region

High-accuracy x-ray line standards in the 3-keV region

Measurement of the charged pion mass using a low-density target of light atoms

X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

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