2012 IEEE 23rd International Symposium on Software Reliability Engineering 2012
DOI: 10.1109/issre.2012.15
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A Light-Weight Defect Classification Scheme for Embedded Automotive Software and Its Initial Evaluation

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Cited by 23 publications
(16 citation statements)
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“…The reason for such anomalous observation is explainable based on the defect inflow data and characteristics of models. As it can be seen the inconsistency is significant mainly for Delayed and Inflection S-shaped models -this occurs for a reason; it has been demonstrated in earlier studies [33], [34] that defect inflow profile in automotive software projects often is characterized by presence of late defects. Late defects are not a standard characteristic of normal S-shaped curve which is based on inverted bell shaped inflow profile.…”
Section: B Which Srgms Have the Best Long Term Predictive Power?mentioning
confidence: 91%
“…The reason for such anomalous observation is explainable based on the defect inflow data and characteristics of models. As it can be seen the inconsistency is significant mainly for Delayed and Inflection S-shaped models -this occurs for a reason; it has been demonstrated in earlier studies [33], [34] that defect inflow profile in automotive software projects often is characterized by presence of late defects. Late defects are not a standard characteristic of normal S-shaped curve which is based on inverted bell shaped inflow profile.…”
Section: B Which Srgms Have the Best Long Term Predictive Power?mentioning
confidence: 91%
“…The current cloud system is an evolution of the previous work on ensuring information reliability done together with Ericsson [SM09a]. In this work we address the problems of ensuring that information is available throughout the enterprise and its understanding [KS02,SKT05,MS10,MST12].…”
Section: Related Workmentioning
confidence: 99%
“…There is a high percentage of not tried or not available cases, in which reporters did not care about this aspect or were not able to establish this value. 3 Considering that, in the literature, this type of defects are reported with percentages around 20-40%, even in critical contexts [23,24], the low percentage can be justified by the scarce focus on establishing if a defect is always reproducible or not. Although the testing phase is not the final one, and more bugs of this type are expected to surface in later stages, our conjecture is confirmed by the high percentage of not tried or not available cases.…”
Section: Fine-grain Analysismentioning
confidence: 99%
“…Oppositely, implementing classification schemes as ODC or HP yields much information on single‐phase efficiency but at higher expense and greater intrusiveness. Their application into real industrial settings can be difficult , because of start‐up costs (e.g., training and process changes), of required customizations (e.g. Ref.…”
Section: Introductionmentioning
confidence: 99%
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