In deep nano-scale and high-integration CMOS technologies, storage circuits have become increasingly sensitive to chargesharing-induced multiple-node-upsets (MNUs) in harsh radiation environments. Muller C-elements are widely used for latch hardening against MNUs, such as triple and even quadruple node-upsets. Existing latch verifications for error-recovery highly rely on EDA tools with complex error-injection combinations. In this paper, a latch design with algorithm-based verification protected against MNUs in harsh radiation environments, is proposed. Due to the formed redundant feedback loops, the latch can completely recover from any MNU. Algorithm-based verification results demonstrate the MNU recovery of the proposed latch. Simulation results demonstrate the low area overhead of the proposed latch compared with the only one existing same-type design.