“…Microfocus beamlines have proven to be invaluable in allowing investigators to determine structures from microcrystalline samples (Cherezov et al, 2007;Coulibaly et al, 2007;Nelson et al, 2005;Rasmussen et al, 2007Rasmussen et al, , 2011Warne et al, 2008). Likewise, next-generation 'diffractionlimited light sources' that will produce brighter X-ray beams than current third-generation synchrotron sources (Biasci et al, 2014;Borland, 2013;Decker, 2014;Einfeld, 2014;Tanaka, 2014) and XFEL sources hold the promise of an even greater impact on such systems (Barends et al, 2014;Boutet et al, 2012;Chapman et al, 2011;Johansson et al, 2012Johansson et al, , 2013Kern et al, 2012Kern et al, , 2013Kern et al, , 2014Kupitz et al, 2014;Liu, Wacker et al, 2013;Redecke et al, 2013;Sawaya et al, 2014). Chip holders used for X-ray diffraction experiments.…”