A machine learning framework to adjust for learning effects in medical device safety evaluation
Jejo D Koola,
Karthik Ramesh,
Jialin Mao
et al.
Abstract:Objectives
Traditional methods for medical device post-market surveillance often fail to accurately account for operator learning effects, leading to biased assessments of device safety. These methods struggle with non-linearity, complex learning curves, and time-varying covariates, such as physician experience. To address these limitations, we sought to develop a machine learning (ML) framework to detect and adjust for operator learning effects.
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