A memory yield improvement scheme combining built-in self-repair and error correction codes

Wu, Tze-Hsin; Chen, Po‐Yuan; Lee, Mincent; Lin, Bin-Yen; Wu, Cheng‐Wen; Tien, C. T.; Lin, Hong‐Ping; Chen, Hao; Peng, Ching-Nen; Wang, Min-Jer

doi:10.1109/test.2012.6401576

Cited by 20 publications

(10 citation statements)

References 18 publications

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“…The scrubbing interval t s is set to occur every 6 minutes, while selftest and repair is set to occur every 10 days. The reliability of the proposed strategy is compared to the reliability of the traditional combined approach strategy [2], [5], where only uncorrectable words are repaired, while correctable words are left to the ECC.…”

Section: Reliability Evaluationmentioning

confidence: 99%

“…To enable memory yield enhancement, repair using comprehensive redundancy scheme has been used. In order to enhance yield further, a combined approach of error correction code (ECC) and redundancy scheme is introduced [2]. Also, errors caused by hardware faults are becoming a threat to field reliability.…”

Section: Introductionmentioning

confidence: 99%

“…ECCs are typically integrated into memory architectures to make them immune to errors. Combined approaches of using both repair and ECC give a synergistic effect to improve both yield and reliability, and have been explored in several works [2]- [6]. In this work, we present how the combined approach can be adapted into an in-field repair strategy, in order to enhance reliability.…”

Section: Introductionmentioning

confidence: 99%

“…The work [2] enhances yield by allowing correctable words to be shipped since ECC will be able to handle them during system use. The work [5] improves reliability by performing in-field self-repair only to uncorrectable words, letting ECC handle correctable words, and preserving remaining spare elements for future uncorrectable words.…”

Section: Introductionmentioning

confidence: 99%

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Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair

Mayuga

Yamato

Yoneda

et al. 2016

IEICE Trans. Inf. & Syst.

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SUMMARY Embedded memory is extensively being used in SoCs, and is rapidly growing in size and density. It contributes to SoCs to have greater features, but at the expense of taking up the most area. Due to continuous scaling of nanoscale device technology, large area size memory introduces aging-induced faults and soft errors, which affects reliability. In-field test and repair, as well as ECC, can be used to maintain reliability, and recently, these methods are used together to form a combined approach, wherein uncorrectable words are repaired, while correctable words are left to the ECC. In this paper, we propose a novel in-field repair strategy that repairs uncorrectable words, and possibly correctable words, for an ECC-based memory architecture. It executes an adaptive reconfiguration method that ensures 'fresh' memory words are always used until spare words run out. Experimental results demonstrate that our strategy enhances reliability, and the area overhead contribution is small. key words: memory repair, memory reliability, in-field test and repair, ECC, in-field repair strategy, remapping

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Section: Reliability Evaluationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair

Mayuga

Yamato

Yoneda

et al. 2016

IEICE Trans. Inf. & Syst.

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“…Different protection capabilities can be achieved according to the estimation results of the achieved reliability levels. An ECC-Enhanced Memory Repair (EEMR) scheme for yield improvement of embedded memories is proposed in [16]. This work evaluates the back-end flow that combines both ECC and BIRA to determine whether yield can be improved by proper sequencing of the two steps.…”

Section: Introductionmentioning

confidence: 99%

Fault Scrambling Techniques for Yield Enhancement of Embedded Memories

Jheng

Hashizume

et al. 2013

2013 22nd Asian Test Symposium

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Instead of merely using redundant rows/columns to replace faulty cells, error-correcting codes are also considered an effective technique to cure permanent faults for the enhancement of fabrication yield and reliability of memories. However, if the number of faulty bits in a codeword is greater than 1, the protection capability of the widely used SEC-DED (single-error correction and double-error detection) codes will be limited. In order to cure this dilemma, efficient fault scrambling techniques are proposed in this paper. Unlike the fixed constituting memory cells of a codeword in the conventional EDAC schemes, we try to reconstruct the memory cells of codewords such that each codeword consists of at most one faulty cell. The corresponding scrambling circuits are also proposed and a simulator is developed to evaluate the repair rates and hardware overhead. According to experimental results, the repair rates can be improved significantly with negligible hardware overhead.

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Fuzzy Inference Procedure for Intelligent and Automated Control of Refrigerant Charging

Damaj¹,

Saade²,

Al-Faisal³

et al. 2018

Int. J. Fuzzy Syst.

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Fuzzy logic controllers are readily customizable in natural language terms, and can effectively deal with non-linearities and uncertainties in control systems. This paper presents an intelligent and automated fuzzy control procedure for the refrigerant charging of refrigerators. The elements that affect the experimental charging and the optimization of the performance of refrigerators are fuzzified and used in an inference model. The objective is to represent the intelligent behavior of a human tester, and ultimately make the developed model available for the use in an automated data acquisition, monitoring, and decision-making system. The proposed system is capable of determining the needed amount of refrigerant in the shortest possible time. The system automates the refrigerant charging and performance testing of parallel units. The system is built using data acquisition systems from National Instruments and programmed under LabVIEW. The developed fuzzy models, and their testing results, are evaluated according to their compatibility with the principles that govern the intelligent behavior of human experts when performing the refrigerant charging process. In addition, comparisons of the fuzzy models with classical inference models are presented. The obtained results confirm that the proposed fuzzy controllers outperform traditional crisp controllers and provide major test time and energy savings. The paper includes thorough discussions, analysis, and evaluation.

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A memory yield improvement scheme combining built-in self-repair and error correction codes

Cited by 20 publications

References 18 publications

Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair

Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair

Fault Scrambling Techniques for Yield Enhancement of Embedded Memories

Fuzzy Inference Procedure for Intelligent and Automated Control of Refrigerant Charging

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