A method of evaluating the temperature dependences of dielectric resonators and materials

Kobayashi, Yoshihiro; Kogami, Yoshinori; Katoh, Masahiko

doi:10.1109/euma.1993.336627

Cited by 7 publications

(3 citation statements)

References 4 publications

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“…Other possibilities to calculate the s f of ceramic dielectric are given by the works of Taheri 13 and Kobayashi, 14 where they calculate empirically the value of s f . The Eq.…”

Section: Traditional Methodsmentioning

confidence: 99%

An alternative method for the measurement of the microwave temperature coefficient of resonant frequency (τf)

Silva¹,

Fernandes²,

Sombra³

2012

Journal of Applied Physics

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“…Other possibilities to calculate the s f of ceramic dielectric are given by the works of Taheri 13 and Kobayashi, 14 where they calculate empirically the value of s f . The Eq.…”

Section: Traditional Methodsmentioning

confidence: 99%

An alternative method for the measurement of the microwave temperature coefficient of resonant frequency (τf)

Silva¹,

Fernandes²,

Sombra³

2012

Journal of Applied Physics

View full text Add to dashboard Cite

show abstract

“…The temperature coefficient of resonant frequency (t f ) of the dielectric resonator, temperature coefficient of permittivity (t 3 ) and the linear expansion coefficient (a) of the dielectric material can be related as follows [20,21]: The variation of resonant frequency with temperature is crucial in many microwave applications. The temperature coefficient of frequency, t f , of a material gives an indication of the frequency stability of circuits or devices.…”

Section: Resultsmentioning

confidence: 99%

Low temperature microwave characterisation of lithium fluoride at different frequencies

Jacob

2005

Science and Technology of Advanced Materials

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Precise knowledge of dielectric properties of materials is required to implement the material in high frequency devices and circuits. At microwave frequencies complex permittivity (dielectric constant and loss tangent) are the two mandatory parameters prior to any design. We have identified Lithium Fluoride as a potential candidate, which can be used in conjunction with superconducting and non-superconducting parts of several microwave communication devices. Even though dielectric constant of LiF is known at room temperature there only limited data presented at cryogenic temperatures. We have used a dielectric post resonator for the microwave characterisation of the rod shaped LiF crystal. In this paper, we have reported the dielectric constant (perpendicular component of the real part of complex permittivity) and loss tangent of two LiF crystals as a function of temperature (15-290 K) at frequencies of 8 and 16.5 GHz. We have also studied and reported the temperature coefficient of frequency and permittivity. The concept of using temperature coefficient of frequency as a standard is proved to be wrong in this paper. Microwave properties of other Fluorides are also compared with the LiF crystal. q

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“…The parallel plate type resonator method is used for τ f measurement, but the smaller loaded Q value lowers the accuracy of τ f measurement. To increase the accuracy of τ f measurement, Kobayashi et al [2] proposed the shielded dielectric resonator of an image type to measure τ f and introduced the intrinsic temperature coefficient of f o , τ f 0 to evaluate the temperature dependences of dielectric materials, but did not give a detailed procedure of getting the coefficients of τ f 0 polynomial. Abramowicz and Modelski [3] developed a microwave integrated circuit (MIC) type resonator to measure τ f , and a similar τ f 0 polynomial was obtained, but they did not explain how to get the coefficients of τ f 0 polynomial.…”

Section: Introductionmentioning

confidence: 99%

Temperature Coefficient Measurement of Microwave Dielectric Materials Using Closed Cavity Method

Cao¹,

Yan²,

Yin³

2016

PIER Letters

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The closed cavity method is proposed to measure the frequency temperature coefficient (τ f) of a dielectric resonator. The τ f polynomial, which is linear combination of the temperature coefficient of relative dielectric constant and the linear expansion coefficient of the dielectric and cavity, is given. The coefficients of τ f polynomial are discussed in detail. The intrinsic temperature coefficient of resonant frequency (τ f 0) is introduced to improve the measurement precision. Resonators made of BaO-TiO 2-Sm 2 O 3 and (Zr 0.8 Ti 0.2)TiO 4 ceramics with Teflon and alumina as supports were measured. The results show that the τ f values of the same resonator with above supports are different, and the measured variation between them is more than 3 ppm/ • C. Using the concept of τ f 0 , the variation is less than 2 ppm/ • C.

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A method of evaluating the temperature dependences of dielectric resonators and materials

Cited by 7 publications

References 4 publications

An alternative method for the measurement of the microwave temperature coefficient of resonant frequency (τf)

An alternative method for the measurement of the microwave temperature coefficient of resonant frequency (τf)

Low temperature microwave characterisation of lithium fluoride at different frequencies

Temperature Coefficient Measurement of Microwave Dielectric Materials Using Closed Cavity Method

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