A method to measure dielectric parameters in 5?0.5 millimeter wavelength band

Dryagin, Yu. A.; Паршин, В.В.

doi:10.1007/bf01009626

Cited by 36 publications

(14 citation statements)

References 9 publications

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“…The wavelength of resonance for each sample disc is determined as described in [6]. The sample is translated along the axis to a position with antinodes at the surfaces, i.e.…”

Section: Methodsmentioning

confidence: 99%

“…However, if the frequency of measurement is adjusted until the sample etalon is also resonant, i.e. has an optical thickness that is an integer multiple of one-half wavelength, the spectrum of the resonator is unchanged and the measurement of the index of refraction and the loss tangent is greatly simplified [6,7]. Under this resonant sample condition, translation of the sample along the resonator axis for several wavelengths has negligible effect on the eigenfrequencies of the resonator.…”

Section: Resonator With Samplementioning

confidence: 98%

“…The resonator used in this project is a symmetrical interferometer, consisting of a pair of brass mirrors, coated with silver, and separated by slightly less than two radii. Extensive theoretical analysis has been done for the fields in such a structure [3][4][5][6][7][8]. From these analyses, one can express the loss tangent of a sample in terms of the loaded and unloaded Q of the resonator.…”

Section: Theorymentioning

confidence: 99%

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Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths

Jones

Dutta

Gao

et al. 2011

J Infrared Milli Terahz Waves

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We describe here a system for accurate measurement of the dielectric properties of very low-loss materials in the 130 to 170 GHz frequency range. This system utilizes an open resonator with a quality factor ∼1×10 6 . Resonance curves for this resonator are acquired with a commercial spectrum analyzer equipped with an external millimeter-wave harmonic mixer. The excitation source is a backward-wave oscillator locked to the spectrum analyzer local oscillator via a digital phase-locked loop. This system permits rapid and accurate measurement of resonance curve line widths, permitting determination of loss tangents down to the 10 -6 range. Results are reported for silicon carbide (SiC), CVD diamond, sapphire, and quartz.

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“…The wavelength of resonance for each sample disc is determined as described in [6]. The sample is translated along the axis to a position with antinodes at the surfaces, i.e.…”

Section: Methodsmentioning

confidence: 99%

Section: Resonator With Samplementioning

confidence: 98%

Section: Theorymentioning

confidence: 99%

See 1 more Smart Citation

Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths

Jones

Dutta

Gao

et al. 2011

J Infrared Milli Terahz Waves

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“…Studying dielectric losses in polycrystalline diamonds grown by chemical vapor deposition (CVD) has become very topical in the millimeter-wave range because of considerable progress in the growth technology and the corresponding applications of this previously "exotic" material in modern engineering [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. The grown diamond disks have a number of remarkable electrical and mechanical properties:…”

Section: Introductionmentioning

confidence: 99%

Dielectric losses in CVD diamonds in the millimeter-wave range at temperatures 300?900 K

Паршин

Garin

Myasnikova

et al. 2004

Radiophys Quantum Electron

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UDC 538.955+538.956We study losses in different CVD diamonds in the frequency range 50-210 GHz at temperatures 300-900 K by using a high-Q open Fabry-Perot cavity. It is found that the effective activation energies determining a sharp increase in losses at high temperatures are distributed in the range 0.4-0.8 eV. We propose a formula which relates the frequency and temperature dependences of losses for different CVD-diamond specimens in the first approximation. Suggestions on the nature of these losses are put forward.

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“…In fact, the theory for an open resonator with a resonant plate is simpler than that with an off-resonance plate [10].…”

Section: Comparison Between a Resonant Plate And A Non-resonance Platementioning

confidence: 99%

The Influence of a Coupling Film on Ultra-Low-Loss Dielectric Measurement Using an Open Resonator

Gao

Dutta

Jones

et al. 2011

J Infrared Milli Terahz Waves

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A Fabry-Perot open resonator excited through a coupling film and loaded with a plane-parallel dielectric plate is analyzed. The eigen equation of the field in the resonator is obtained. The quality factors of the resonator with and without a coupling film are compared. The quality factors of the resonator loaded with a plate that is in resonance and off resonance are also compared. It is shown that the difference in coupling losses between a loaded resonator and an unloaded resonator may strongly affect the accuracy in measuring ultra-low loss dielectric material. Some ways to reduce the influence of coupling loss are discussed. Our experiment results are consistent with the numerical analysis.

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A method to measure dielectric parameters in 5?0.5 millimeter wavelength band

Cited by 36 publications

References 9 publications

Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths

Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths

Dielectric losses in CVD diamonds in the millimeter-wave range at temperatures 300?900 K

The Influence of a Coupling Film on Ultra-Low-Loss Dielectric Measurement Using an Open Resonator

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