This review presents a general overview of the field of X-ray diffraction with emphasis being on the directions in which applications and research in the areas of instrumentation, analysis, powder methods, topographic methods, determination of molecular structure, etc., have been going rather than presenting a comprehensive listing of all references in which X-ray diffraction was utilized. To do so would have been a formidable task as the use of X-ray diffraction methods in solving problems in chemistry, material sciences, geology, industry, etc., is extremely widespread, as becomes evident after even a rather superficial scan of the literature. This review covers the period of January 1972 through December 1973, mainly by the appearance of an abstract during this time, although several