Proceedings of the 2009 International Conference on Computer-Aided Design 2009
DOI: 10.1145/1687399.1687489
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A methodology for robust, energy efficient design of Spin-Torque-Transfer RAM arrays at scaled technologies

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Cited by 8 publications
(4 citation statements)
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“…Also another researcher had been determined to figure out an energy efficient on chip available memory design using the spin torque RAM however our main intent of the research is to study the functioning of the various RAM styles on different frequency values [4]. Also an analyst had been researching on developing a methodology aimed at developing a highly durable, less energy consuming spin torque transfer RAM arrays for different technologies however, we have grossly focused on studying RAM styles at different frequency values [5].…”
Section: Related Workmentioning
confidence: 99%
“…Also another researcher had been determined to figure out an energy efficient on chip available memory design using the spin torque RAM however our main intent of the research is to study the functioning of the various RAM styles on different frequency values [4]. Also an analyst had been researching on developing a methodology aimed at developing a highly durable, less energy consuming spin torque transfer RAM arrays for different technologies however, we have grossly focused on studying RAM styles at different frequency values [5].…”
Section: Related Workmentioning
confidence: 99%
“…Chatterjee et al [7] have pointed out that during reading a cell in a selected column, the unselected cells in the column contributes leakage current. This leakage acts as a circuit induced noise to the sensed current and can reduce the sensing accuracy.…”
Section: Sensing Reliability Degradationmentioning
confidence: 99%
“…This leakage acts as a circuit induced noise to the sensed current and can reduce the sensing accuracy. In [7], array level TMR or ATMR is proposed as metric to characterize the effect of this leakage current. ATMR is defined as the ratio of the difference of the array level read current (selected cell current + leakage current of unselected cells) while reading '0' and reading '1' with respect to the read current while reading '1'.…”
Section: Sensing Reliability Degradationmentioning
confidence: 99%
“…Further, during sensing an STTRAM cell, the current flowing through the bit line is sensed. [Chatterjee et al 2009] have pointed out 15:4 S. Chatterjee et al …”
Section: Introductionmentioning
confidence: 99%