5th International Electronic Conference on Sensors and Applications 2018
DOI: 10.3390/ecsa-5-05636
|View full text |Cite
|
Sign up to set email alerts
|

A Microcontroller System for the Automation of Transient Effect Determination of the Spin-Lattice Relaxation Time Using Continuous Wave NMR

Abstract: A simple transient effect method for the determination of the spin-lattice relaxation time using continuous wave NMR (TEDSpiL) with a marginal oscillator was recently reported (doi:10.1002/mrc.4594). Such a system measures a parameter called Tx that is related to T1 and allows T1 to be determined with the aid of calibration samples. For such a system, the process of making the Tx measurement does not require variable parameters and so is ideal for implementing in microcontroller code. In this article, we demon… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2019
2019
2019
2019

Publication Types

Select...
1

Relationship

1
0

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 12 publications
0
1
0
Order By: Relevance
“…Using the 0.3∼mT/K temperature drift reported, this sweep range compensates for fluctuations in field caused by thermal drift. A further in‐depth discussion of the measurement electronics has been reported …”
Section: Methodsmentioning
confidence: 99%
“…Using the 0.3∼mT/K temperature drift reported, this sweep range compensates for fluctuations in field caused by thermal drift. A further in‐depth discussion of the measurement electronics has been reported …”
Section: Methodsmentioning
confidence: 99%