Strain engineering is a relevant optimization route to introduce and/or optimize defects for mixed ionicelectronic conducting oxides. Interfacial strain control of electrical conductivity [1] and resistive switching [2] was reported for sideways-contacted Gd0.1Ce0.9O2-δ|Er2O3 (GCO|ERO) 'microdot' heterostructures with alternating monolayers of insulating ERO and mixed-conducting GCO, whose lattice mismatch yielded compressive strain in the GCO layers. Here we explore these and other GCO heterostructures with alternative straining oxides that impart varying degrees of tensile strain on GCO, such as Bi4NbO8.5|GCO (BNO|GCO). We apply local strain and chemical mapping, along with high resolution imaging in the TEM and scanning TEM (STEM) to provide nanoscale insights regarding strained heterostructure design.We use Raman microscopy to determine the average strain state of the heterostructures, and employ a JEOL ARM200F with the ASTAR precession-enhanced electron nanodiffraction (PEND) system [3] to perform local strain mapping, resolving lattice distortion in the heterolayer systems at the nanometer scale. These strain data are correlated with interface atomic structure, composition and electronic structure characterized by high resolution imaging and electron energy-loss spectroscopy (EELS) in a scanning TEM (STEM).The magnitude of overall in-plane strain was found to increase with the number of heterointerfaces for the ERO and BNO systems, Fig. 1a. These average strain data were corroborated by local strain mapping, e.g. Figure 1c, which exemplifies strain mapping on the BNO|GCO heterostructure system. EELS analysis was performed in addition to strain mapping, exemplified in Fig. 2 for BNO|GCO. In this case asymmetric interface growth wherein cation distributions varied from one interface to the next was observed, Fig. 2a. Characterization of atomic-level structure and composition in these systems, e.g. Fig. 2b, provides nanoscale insights regarding strained heterostructure design [4].