1950
DOI: 10.1038/166315a0
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A Modification to Gabor's Proposed Diffraction Microscope

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Cited by 47 publications
(7 citation statements)
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“…Thus the auxiliary hologram, originally proposed by Bragg in the special case of work in a parallel beam, of twice the focal length of the original hologram, serves to correct for the unwanted elements of the image, however it may be reconstructed. In the Haine and Dyson transmission method (Haine and Dyson 1950;Haine and Mulvey 1952) the auxiliary will be defocused by twice the amount of the main hologram and in the same direction (i.e. underfocused if the main is underfocused, etc.…”
Section: Vtfmentioning
confidence: 99%
“…Thus the auxiliary hologram, originally proposed by Bragg in the special case of work in a parallel beam, of twice the focal length of the original hologram, serves to correct for the unwanted elements of the image, however it may be reconstructed. In the Haine and Dyson transmission method (Haine and Dyson 1950;Haine and Mulvey 1952) the auxiliary will be defocused by twice the amount of the main hologram and in the same direction (i.e. underfocused if the main is underfocused, etc.…”
Section: Vtfmentioning
confidence: 99%
“…Electron holography was invented in 1947 by Gabor [ 3 , 4 ] as one of the aberration correction methods for objective lenses of electron microscopes. At that time, there were several trials to advance electron interferometry [ 5–8 ]; however, it was difficult to obtain electron beams having sufficient coherence. In 1962 holography was first put to practical use by employing a laser beam by Leith and Upatnieks [ 9 ].…”
Section: Introductionmentioning
confidence: 99%
“…In-line electron holography (see illustration in Fig. 1b)115, which is also referred as focal series reconstruction, also works at much lower degrees of spatial coherence than off-axis electron holography, but requires the use of a computational algorithm to solve a non-linear161718 (or, in some cases, approximated linear1920) set of equations. These equations relate the complex electron wavefunction Ψ ( r ) to image intensities I ( r , Δf ) that are usually recorded at multiple planes of focus, each characterized by its defocus Δf from the reference focus at which the wavefunction is to be recovered.…”
mentioning
confidence: 99%