2018
DOI: 10.1063/1.4994879
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A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators

Abstract: This paper presents a modified self-consistent drift-diffusion-reaction model suitable for the analysis of electron-beam irradiated insulators at both short and long time scales. A novel boundary condition is employed that takes into account the reverse electron current and a fully dynamic trap-assisted generation-recombination mechanism is implemented. Sensitivity of the model with respect to material parameters is investigated and a calibration procedure is developed that reproduces experimental yield-energy… Show more

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Cited by 9 publications
(3 citation statements)
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References 65 publications
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“…Finally, we measured the waveguide coupled CL at different diameters using beam spot illumination at 0.5 keV (δ ≈ 10 nm [15]) and 2 keV (δ ≈ 175 nm [15]). Results of these measurements are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Finally, we measured the waveguide coupled CL at different diameters using beam spot illumination at 0.5 keV (δ ≈ 10 nm [15]) and 2 keV (δ ≈ 175 nm [15]). Results of these measurements are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Given the incident distribution of electrons shown in Fig. 2, some of these electrons (those with a high penetration depth) will cross the shielding material and simply reach the FPA (Focal Plane Array) with an almost unchanged energy (Raftari et al, 2018), while some other electrons will loose some of their energy in the shielding material and generate secondary electrons (Pickel et al, 2005). The FPA consists of an HgCdTe layer, which has been grown on a removed CdZnTe substrate (see (Beletic et al, 2008)), linked to its Si ReadOut Integrated Circuit (ROIC) by In bump bonds.…”
Section: Spikes Formation Mechanisms In Hgcdtementioning
confidence: 99%
“…Under e‐beam irradiation, a large number of electrons‐hole pairs generated by scattering are deposited inside the film when they have lost their kinetic energy 8 . This may lead to a local electric field and density gradient, and therefore charge drift, diffusion, trapping and recombination, 9–14 which is calculated self‐consistently. Recent researches show that, the space charge and space potential distributions caused by irradiation are the key factors affecting the secondary electron (SE) current, the transmission current, and accordingly imaging quality and detection accuracy in electron microscopy 15–17 …”
Section: Introductionmentioning
confidence: 99%