A multi-converter DFT technique for complex SIP: Concepts and validation

Abstract

-This paper presents a new technique called "Analog Network of Converters" that allows to test a set of ADCs and DACs embedded in a complex circuit as SiP and SoC. It presents an experimental validation of this new concept that permits to reduce drastically the testing time and requires only a low cost digital ATE.

ADC spectral performance measurement uncertainty in DFT method

“…Spectral performance test uncertainty is also investigated in [4] emphasizing noise and SNR. However, test accuracy of THD and SFDR is usually claimed by experience [5] without concrete foundation. Test uncertainty of spectral performance including THD and SFDR still needs to be investigated more detailedly.…”

“…Suppose the k th and M-k bin in the spectrum capture the i th harmonic component. So the i th harmonic power is calculated from two bins as shown in (5). Since M-k bin is the conjugate of k th bin, the power can be expressed as two times of the power of k th bin.…”

(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

“…Recently, a new idea has emerged for the efficient testing of systems where several DACs and ADCs exist, no matter the relative accuracy of these converters [20]. A sequential procedure, involving every converter, is scheduled witih the SoC to allow for the testing of all of them.…”