A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map

Shin, Jin-Su; Lee, Dong-Hee

doi:10.1007/978-3-031-58113-7_18

Lecture Notes in Business Information Processing

2024

DOI: 10.1007/978-3-031-58113-7_18

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A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map

Jin-Su Shin,

Dong-Hee Lee

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A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map

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References 14 publications

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