“…The SI process is only for the structural parameters, it is called parameter identification. A great amount of researches with various methodologies have been conducted in parameter identification, such as artificial neural network approach (ANN) [1], wavelet analysis method [2], Fourier transform based method [3], finite element-based Iterative Least-squares methods (ILS) [4,5,6], frequency domain decomposition (FDD) [7], natural excitation technique coupled with eigen-system realization algorithm (NExT-ERA) [8], Random decrement technique (RDT) [9], extended Kalman filter technique (EKF) [10,11], and so on.…”