2008
DOI: 10.1109/tmtt.2008.916917
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A New Analytical Method for Robust Extraction of the Small-Signal Equivalent Circuit for SiGe HBTs Operating at Cryogenic Temperatures

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Cited by 11 publications
(11 citation statements)
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“…3) When the highest order terms in (13) and (14) are chosen as 3 (i.e., ), we can arrive at the following expressions:…”
Section: A Distributed Network For Link Base Region (Region I)mentioning
confidence: 99%
See 1 more Smart Citation
“…3) When the highest order terms in (13) and (14) are chosen as 3 (i.e., ), we can arrive at the following expressions:…”
Section: A Distributed Network For Link Base Region (Region I)mentioning
confidence: 99%
“…Some of them are based on the numerical optimization and the results might be nonphysical [13]. To overcome this problem, some analytical or semianalytical methods are proposed [14]- [18] in which all the elements are mainly obtained by an analytical equation derived under certain assumptions and approximations. The approximations are based on the frequency dependence of the model parameters, assuming that the higher order terms in frequency are generally much smaller than the lower ones; therefore, the higher order terms can be ignored to simplify the equivalent-circuit equation [19].…”
mentioning
confidence: 99%
“…For example, when we directly optimize the measured Y-parameters without constraints, the emitter resistance tends to be bias dependent, which is obviously unphysical [5]. Thus, as demonstrated by [8][9][10][11][12][13][14], a trend has been observed toward analytical or semianalytical parameter extractions, where all the elements in the small-signal equivalent circuit were obtained by analytical equations directly. However, the derived circuit equations have been more or less simplified either by neglecting some terms depending on the frequency range (low-middle-high frequencies) or by making some assumptions and approximations specifically for facilitating the direct parameter extraction.…”
Section: Introductionmentioning
confidence: 99%
“…The available previous few works that directly extract π‐topology model of the Si/SiGe HBT devices are introduced in Refs. 9–12. Special polarization for the device, frequency approximations, and least square fit are needed to extract the model parameters [9, 11].…”
Section: Introductionmentioning
confidence: 99%