A new approach for local detection of failures and global diagnosis of LV switchboards

Abstract

This paper deals with an original diagnosis system for LV switchboards. It is based on a local and global diagnosis approach with local temperature and current measurements. The thermal measurements including ambient and temperatures near electrical joint, are done by wireless thermal sensors. The system is composed of three complementary stages: An internet data collection stage, and two centralized data processing stages for the local detection of failures and the global diagnosis respectively. The analyses done with the diagnosis stage lead to predictive maintenance recommendations in order to avoid LV switchboard breakdown, which although rare could be catastrophic. Each stage of the centralized data processing is presented and discussed. Some results based on experimental data and expertise's information are presented to validate the feasibility of these methods.

Joint faults detection in LV switchboard and its global diagnosis, through a Temperature Monitoring System

“…Section 2 will be devoted to the detection stage, by comparison with a healthy thermal model. Another approach of detection, presented in a previous paper [1], may be to use an estimator based on training process with neural network.We will not go into that in this paper. Section 3 will be dedicated to the global diagnosis stage using the technique of Bayesian networks.…”