2009 4th International Design and Test Workshop (IDT) 2009
DOI: 10.1109/idt.2009.5404157
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A new approach for sensing and measuring the incident radiation on semiconductor mercury-cadmium-telluride (MCT) detector

Abstract: In this paper a new circuit for sensing and measuring the incident radiation on a constant-voltage biased infrared semiconductor mercury-cadmiumtelluride (MCT) detector is presented. The circuit is built around the current-feedback operational amplifier (CFOA). Moreover, a mathematical model for the relationship between the output voltage and incident radiation is obtained. The model, basically a sine-series function, can easily yield closed-form expressions for the harmonic and intermodulation performance of … Show more

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