A New Charging Model for Spacecraft Exposed Dielectric (SICCE)

Wang, Song; Wu, Zhancheng; Tang, Xiaojin; Zhong, Yi; Sun, Yuan

doi:10.1109/tps.2016.2521867

Cited by 9 publications

(9 citation statements)

References 23 publications

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“…In order to solve Equation of net current density, necessary expressions of secondary and backscattered current density are presented below. Secondary electron current density due to electrons ( j se ) is represented as,

j_{se} = e ((), \frac{2 π}{m_{e}^{2}}) \int_{0}^{\infty} Y_{se} ((), E) italicEf ((), E) italicdE exp ((), \frac{{eV}_{s}}{{kT}_{e}}),

where Y se and E are electron‐induced SEY and incident electron energy, respectively, and f(E) is Maxwellian space plasma velocity distribution of ambient electrons given by,

f ((), E) = n_{e} {(\frac{m_{e}}{2 π {kT}_{e}})}^{\frac{3}{2}} exp ((), \frac{- E}{{kT}_{e}}), E = \frac{1}{2} m_{e} v_{e}^{2},

where T e , n e , m e , and v e are electron temperature, density, mass, and velocity, respectively.…”

Section: Problem Formulationsmentioning

confidence: 99%

“… Secondary electron current density due to ions ( j si ) is represented as,

j_{si} = e ((), \frac{2 π}{m_{i}^{2}}) \int_{0}^{\infty} Y_{si} ((), E - italiceV) italicEf ((), E) italicdE ((), 1 - \frac{{italiceV}_{s}}{{italickT}_{i}}) .

Y si , ion induced SEY is given as for isotropic incidence,

Y_{si} = ((), 2 - \frac{Q}{2}) 2^{- Q} δ_{1} E^{1 / 2} ((), 1 + \frac{E}{E_{m}}),

italicwhere, Q = ({, \begin{array}{l} 0 \\ \frac{1}{E} - 0.1 \\ 2 \end{array}) \begin{matrix} lefttrue \\ ; E > 10 keV \\ ; 0.476 keV < E < 10 keV \\ ; E < 0.476 keV \end{matrix} .

…”

Section: Problem Formulationsmentioning

confidence: 99%

“…Here, δ 1 is yield at 1 keV, and E m is energy for maximum yield. Backscattered electron current density due to electrons ( j be ) is represented as,

j_{be} = e ((), \frac{2 π}{m_{e}^{2}}) \int_{0}^{\infty} Y_{be} ((), E) italicEf ((), E) italicdE exp ((), \frac{{eV}_{s}}{{kT}_{e}}) .

BEY ( Y be ) can be obtained from incident electron energy and material atomic number ( Z ) from Table …”

Section: Problem Formulationsmentioning

confidence: 99%

“…Two sets of simultaneous equations, obtained from Equation (17) after substituting Equation (18) and point matching method using the Dirac delta function as the testing function are as follows: where N 1 and N 2 are the number of triangular subsections in pyramid and cuboid, respectively. Coefficients l 11 mn , l 12 mn , l 21 mn , and l 22 mn appearing in Equations (19) and (20) are represented in a generalized form as,…”

Section: Absolute Charging Estimationmentioning

confidence: 99%

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Impact of secondary and backscattered electron currents on absolute charging of structures used in spacecraft

Pandya

Mehta

Kothari

2019

Int J Numerical Modelling

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This article analyzes absolute charging of a metallic pyramid in single Maxwellian normal and worst cases of plasma environment. Capacitance of a pyramid for estimation of body potential is computed by the Method of Moments. Body potential temporal variation is obtained by numerically integrating the differential equation using the fourth order Runge‐Kutta method. Owing to a well‐known fact that diverse secondary and backscattered electron yields for different materials is the prime reason for most destructive differential charging, this work includes impact of normal and isotropic incidence of particles for a metal surface of aluminum. The decisive inferences related to these properties together with temporal variation of body potential are compared. Our computational results reveal a significant difference in the estimation of absolute charging in comparison with the same reported earlier.

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j_{se} = e ((), \frac{2 π}{m_{e}^{2}}) \int_{0}^{\infty} Y_{se} ((), E) italicEf ((), E) italicdE exp ((), \frac{{eV}_{s}}{{kT}_{e}}),

where Y se and E are electron‐induced SEY and incident electron energy, respectively, and f(E) is Maxwellian space plasma velocity distribution of ambient electrons given by,

f ((), E) = n_{e} {(\frac{m_{e}}{2 π {kT}_{e}})}^{\frac{3}{2}} exp ((), \frac{- E}{{kT}_{e}}), E = \frac{1}{2} m_{e} v_{e}^{2},

where T e , n e , m e , and v e are electron temperature, density, mass, and velocity, respectively.…”

Section: Problem Formulationsmentioning

confidence: 99%

“… Secondary electron current density due to ions ( j si ) is represented as,

j_{si} = e ((), \frac{2 π}{m_{i}^{2}}) \int_{0}^{\infty} Y_{si} ((), E - italiceV) italicEf ((), E) italicdE ((), 1 - \frac{{italiceV}_{s}}{{italickT}_{i}}) .

Y si , ion induced SEY is given as for isotropic incidence,

Y_{si} = ((), 2 - \frac{Q}{2}) 2^{- Q} δ_{1} E^{1 / 2} ((), 1 + \frac{E}{E_{m}}),

italicwhere, Q = ({, \begin{array}{l} 0 \\ \frac{1}{E} - 0.1 \\ 2 \end{array}) \begin{matrix} lefttrue \\ ; E > 10 keV \\ ; 0.476 keV < E < 10 keV \\ ; E < 0.476 keV \end{matrix} .

…”

Section: Problem Formulationsmentioning

confidence: 99%

“…Here, δ 1 is yield at 1 keV, and E m is energy for maximum yield. Backscattered electron current density due to electrons ( j be ) is represented as,

j_{be} = e ((), \frac{2 π}{m_{e}^{2}}) \int_{0}^{\infty} Y_{be} ((), E) italicEf ((), E) italicdE exp ((), \frac{{eV}_{s}}{{kT}_{e}}) .

BEY ( Y be ) can be obtained from incident electron energy and material atomic number ( Z ) from Table …”

Section: Problem Formulationsmentioning

confidence: 99%

Section: Absolute Charging Estimationmentioning

confidence: 99%

See 2 more Smart Citations

Impact of secondary and backscattered electron currents on absolute charging of structures used in spacecraft

Pandya

Mehta

Kothari

2019

Int J Numerical Modelling

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“…The charge accumulation can be damaging to the Kapton and eventually compromises the thermal blanket function. Potential differences appear on the surface of the Kapton due to energetically charged particle impacts, and when the potential difference exceeds a certain threshold, surface discharge happens (4) . The breakdown discharge on the surface of the Kapton causes damages in its structure and can affect other components of the satellites as antennas and on-board electronics.…”

Section: Introductionmentioning

confidence: 99%

Effect of nitrogen plasma immersion ion implantation on surface electrical breakdown strength of the aluminized polyimide

Marcondes

Ueda²,

Rossi³

2018

RBAV

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To date, there are relatively few studies on polymer applications in space, especially those related to the evaluation of the dielectric breakdown resistance in the space environment. Polyimide (Kapton TM ) is extensively used in space in the thermal control of satellites but as a soft material subject to the aggressive space environment, it experiences degradation of properties during its lifetime. One property commonly affected in space is the surface electrical breakdown strength. The accumulation of charges on the surface of the Kapton occurs due to the formation of low-density hot plasma around the surface and due to the bombardment by highly energetic charged particles from space. The accumulation of charges can lead to deleterious electrical discharge on the surface of the material. In this study, aluminized Kapton, in the form of a film, has been treated by nitrogen plasma immersion ion implantation (PIII) inside a metallic tube. Mesh assisted and non-mesh assisted PIII have been tested. The influence of the ion implantation on the surface electrical breakdown strength of the treated samples has been determined using Weibull probability distribution function. The morphology of treated samples has been characterized by Atomic Force Microscopy. Results of the PIII treatment on morphology and surface electrical breakdown strength of Kapton are presented and discussed in this paper.

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A comparative study of body potential transient profile of geosynchronous orbit spacecraft in single and double Maxwellian plasma models

Pandya

Kothari

Alad

2021

Int J Numerical Modelling

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Estimation of the transient profile of body potential of spacecraft in recommended cases of plasma models is crucial because of its importance to estimate electrostatic discharge (ESD) events. The spacecraft structure consisting of a cuboid with two coplanar rectangular plates is modeled as a lumped equivalent capacitance circuit. Method of moments is used to compute absolute and coupled capacitances, which directly affect the transient profile of body potential. Additionally, closer to the actual plasma model representing substorm injection events is vital for reliable estimation of absolute charging. Accordingly, in this work, we attempt a comprehensive analysis of the charging of a spacecraft in Maxwellian plasma models with the inclusion of induced electron yields for the probable particle incidences. Subsequently, the critical range of particle energy susceptible to failures related to ESD is investigated for a spacecraft structure of Aluminum. The comparison of transient variations of body potential in single and double Maxwellian plasma environments identifies the critical aspects of normal and worst cases concerning the prediction of ESD events, which can be useful in the early stage of a spacecraft design.

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A New Charging Model for Spacecraft Exposed Dielectric (SICCE)

Cited by 9 publications

References 23 publications

Impact of secondary and backscattered electron currents on absolute charging of structures used in spacecraft

Impact of secondary and backscattered electron currents on absolute charging of structures used in spacecraft

Effect of nitrogen plasma immersion ion implantation on surface electrical breakdown strength of the aluminized polyimide

A comparative study of body potential transient profile of geosynchronous orbit spacecraft in single and double Maxwellian plasma models

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