1984
DOI: 10.1107/s002188988401195x
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A new diffractometer using a curved position-sensitive detector and its applications to X-ray crystallography

Abstract: A new curved linear position-sensitive detector has been developed and used in a computer-controlled high-speed data collection system with Weissenberg geometry for X-ray crystallography. This detector system enables one to see the entire Weissenberg diagram on a CRT display monitor in real time.A comparison between refinement results of the roomtemperature phase of LiRbSO4 by this system and a conventional four-circle diffractometer showed that the atomic coordinates almost agree within the experimental error… Show more

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