2018
DOI: 10.1002/etep.2597
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A new embedded power quality event classification system based on the wavelet transform

Abstract: Summary In this paper, a real time embedded intelligent recognition system is proposed for diagnosing the power quality problems. The intelligent recognition system has a structure capable of classifying and detecting the power quality problems in real time. Hardware applications of the wavelet transform and decision tree classifier are realized inside the recognition system using with field programmable gate array (FPGA) device. These methods operating as embedded in the FPGA environment provide real‐time dia… Show more

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Cited by 49 publications
(32 citation statements)
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“…However, several unanticipated irregularities happen in the power supply due to different reasons, which in turn can cause many problems for consumers like malfunction and failure of their equipment. Consequently, the power quality has been turned into a growing concern in power grids . Among power quality problems, voltage fluctuations (flickers) have attracted more attention because of their numerous and frequent happenings .…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…However, several unanticipated irregularities happen in the power supply due to different reasons, which in turn can cause many problems for consumers like malfunction and failure of their equipment. Consequently, the power quality has been turned into a growing concern in power grids . Among power quality problems, voltage fluctuations (flickers) have attracted more attention because of their numerous and frequent happenings .…”
Section: Introductionmentioning
confidence: 99%
“…Consequently, the power quality has been turned into a growing concern in power grids. [1][2][3][4] Among power quality problems, voltage fluctuations (flickers) have attracted more attention because of their numerous and frequent happenings. [5][6][7][8][9] In general, voltage flicker is a periodical or fortuitous deviations of the voltage waveform.…”
Section: Introductionmentioning
confidence: 99%
“…The features are generated from the selected band limited IMF estimated from adaptive VMD and XVMD for different PQ disturbances along with faults and islanding problems . The XVMD based techniques needs simple features to classify the disturbances in less time as compared to the VMD based methods.…”
Section: Feature Extraction From Optimal Blimfsmentioning
confidence: 99%
“…Generally, in literature after extraction of PQD signal, the mean root‐mean‐square (rms) values of current and voltage, the coefficient of skewness, standard deviation, entropy, energy, etc, are extracted, and used as a feature vector and input to a classifier. Nevertheless, these techniques are not good enough for multiple disturbances …”
Section: Introductionmentioning
confidence: 99%