2013
DOI: 10.1149/05201.0105ecst
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A New High Speed Low Power Dissipation Three-Element Si-Based SRAM Cell

Abstract: A novel SRAM cell expected to increase the SRAM integration density is proposed and demonstrated with a test structure in this work. It consists of three elements: a MOSFET, a load, and a bistable PNPN diode as the storage element. The PNPN diode and the load can be integrated in a vertically stacked structure, which can be scaled as small as the design rules allow, and the MOSFET has a small gate width, so the new SRAM cell offers the possibility for much higher integration density compared to the conventiona… Show more

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Cited by 2 publications
(2 citation statements)
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“…A key component of this effect is a threshold switch that represents monostable resistive switching accompanied by the S‐shape NDR effect . Threshold switching behavior has been observed in a wide range of materials systems, such as higher chalcogenides, Mott insulators, and Shockley diodes . Recently, Pickett et al proposed an LIF neuron model using a pair of Pearson‐Anson oscillators referred to as a “neuristor.” Each oscillator includes an NbO 2 ‐based Mott insulator sandwiched between inert Pt electrodes that exhibits threshold switching with respect to an applied voltage, which in turn leads to a change in lattice temperature crossing the critical temperature.…”
Section: Neuromorphic Computingmentioning
confidence: 99%
“…A key component of this effect is a threshold switch that represents monostable resistive switching accompanied by the S‐shape NDR effect . Threshold switching behavior has been observed in a wide range of materials systems, such as higher chalcogenides, Mott insulators, and Shockley diodes . Recently, Pickett et al proposed an LIF neuron model using a pair of Pearson‐Anson oscillators referred to as a “neuristor.” Each oscillator includes an NbO 2 ‐based Mott insulator sandwiched between inert Pt electrodes that exhibits threshold switching with respect to an applied voltage, which in turn leads to a change in lattice temperature crossing the critical temperature.…”
Section: Neuromorphic Computingmentioning
confidence: 99%
“…The S-shaped NDR engaged in threshold switching has been observed in not only amorphous higher chalcogenides [23][24][25] but also various systems such as Mott insulators, 18,26 open-base bipolar junctions, 27 and Shockley diodes. 28,29 The amorphous GeSe in the TS is an As-free chalcogenide material whose details in film deposition can be seen elsewhere. 24 The S-shaped NDR causing the on-state drives a large current flow, and thus high power dissipation (Joule heating).…”
Section: Resultsmentioning
confidence: 99%