“…The filter is based upon knowledge of the probe/flaw interaction, which can be used to determine the spatial frequency at which the flaw will occur. As shown in [4], an estimate of the spatial flaw frequency is given by, (2) where fr is the rotation frequency, R rev is the radius of probe revolution, and P fp is the induced eddy current distribution on the sample surface, or probe footprint. Voltage variations caused by the sources mentioned above will typically occur at the probe rotation frequency (except for lift-off which causes a DC shift) while, for 21tR rev > P fp ' the spatial flaw frequency will be greater than the rotation frequency.…”