A New Investigation on Erase VT Variation of NOR Flash fabricated with 90 nm Technology

Kim, T.Y.; Lee, W.H.; Han, Jung In; Lee, S.E.; Lee, H.G.; Kim, S.Y.; Park, J.H.; Park, S.W.; Choi, Jinhan; Cho, M.K.; Song, Young-Eun; Kim, Kinam

doi:10.7567/ssdm.2003.b-6-2

Extended Abstracts of the 2003 International Conference on Solid State Devices and Materials 2003

DOI: 10.7567/ssdm.2003.b-6-2

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A New Investigation on Erase VT Variation of NOR Flash fabricated with 90 nm Technology

T.Y. Kim¹,

W.H. Lee²,

Jung In Han³

et al.

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A New Investigation on Erase VT Variation of NOR Flash fabricated with 90 nm Technology

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