1997
DOI: 10.1016/s0041-624x(97)00012-7
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A new method for measuring surface acoustic wave speeds by acoustic microscopes and its application in characterizing laterally inhomogeneous materials

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Cited by 7 publications
(3 citation statements)
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“…The method of investigating cells on silicon rubber was introduced by Harris (Harris, 1982;Harris et al, 1980). V(f) curves have recently been used by materials scientists for characterizing horizontally and vertically layered materials (Nagy and Adler, 1990;Ghosh et al, 1997).…”
Section: Introductionmentioning
confidence: 99%
“…The method of investigating cells on silicon rubber was introduced by Harris (Harris, 1982;Harris et al, 1980). V(f) curves have recently been used by materials scientists for characterizing horizontally and vertically layered materials (Nagy and Adler, 1990;Ghosh et al, 1997).…”
Section: Introductionmentioning
confidence: 99%
“…Bogy and Gracewski obtained an analytical expression of the reflection coefficient for a one-layer system, which can be used for the simulation of V(ω, z) [54 -56]. In SAM, the curve V(ω, z) is often called V(f) [37,57,58].…”
Section: Theory Of Time-resolved Acoustic Microscopymentioning
confidence: 99%
“…The dispersion of the Rayleigh wave can be used to extract elastic mechanical parameters like the Young´s modulus, because the Rayleigh wave velocity depends on the density as well as the elastic constants. In this sense, the determination of the Rayleigh wave velocities is of high interest for the characterization of materials-especially of coatings-and was studied via LUS in, e.g., [3][4][5][6] and via SAM in, e.g., [8,[16][17][18][19]. In the past, I(z) measurements have been investigated analytically via ray theory [7,20,21] and via wave theory approaches [7,22].…”
Section: Introductionmentioning
confidence: 99%