2012
DOI: 10.1143/jjap.51.116602
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A New Method for Negative Bias Temperature Instability Assessment in P-Channel Metal Oxide Semiconductor Transistors

Abstract: Bi-lateral force measurements on the supporting limbs in postural sway while standing still were carried out to evaluate postural stability of craniocerebral injured (CCI) patients. Brain pathology of these patients was characterised by CT scans and MRI, as well as by their cognitive and behavioural disturbances. Normal subjects of the same age group were tested as controls. From the force tracings obtained, three oscillation frequencies were identified, with orders of magnitudes of 6, 1.5 and 0.1 Hz, respec… Show more

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Cited by 9 publications
(2 citation statements)
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“…Charge pumping (CP) technique is used to evaluate interface traps in MOS transistors. However, oxide traps near an oxide-semiconductor interface can provide CP current and be detected via the CP technique [113,117]. Maneglia et al [113] speculated that the CP method is an effective method to measure slow N ot in Si MOS systems.…”
Section: Cp Methodsmentioning
confidence: 99%
“…Charge pumping (CP) technique is used to evaluate interface traps in MOS transistors. However, oxide traps near an oxide-semiconductor interface can provide CP current and be detected via the CP technique [113,117]. Maneglia et al [113] speculated that the CP method is an effective method to measure slow N ot in Si MOS systems.…”
Section: Cp Methodsmentioning
confidence: 99%
“…The model has been implemented through a unified reliability interface on Cadence Relxpert simulator [29] normalΔvth=A0exp)(EoxE0exp)(EaKTthickmathspacetn In the model, n presents the power‐law exponent, E a (eV) the activation energy, E 0 (V/cm) the critical field, an A 0 (V/s) the pre‐factor parameter. These fit parameters have been extracted, using on‐the‐fly oxide‐trap [30], from experimental data of NBTI degradation on PMOS devices of a test structures chip we designed and fabricated with TSMC CMOS 0.18 µm technology.…”
Section: Simulation Setup and Nbti Modelmentioning
confidence: 99%