2001
DOI: 10.1109/94.959694
|View full text |Cite
|
Sign up to set email alerts
|

A new method for space charge measurements in dielectric films for power capacitors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2002
2002
2019
2019

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 18 publications
(2 citation statements)
references
References 6 publications
0
2
0
Order By: Relevance
“…57 The main difference between the TSM is that employed to have a better resolution using a thermal excitation over a long period of time rather than a single stimulus. 58 As a matter of fact, the thermal excitation brought by the radiating electrode does not give sufficient resolving power for the space charge measurement in thin dielectric films (due to a high number of information lost during the beginning of the transient current).…”
Section: E Alternative Thermal Wave Methods (Atwm)mentioning
confidence: 99%
“…57 The main difference between the TSM is that employed to have a better resolution using a thermal excitation over a long period of time rather than a single stimulus. 58 As a matter of fact, the thermal excitation brought by the radiating electrode does not give sufficient resolving power for the space charge measurement in thin dielectric films (due to a high number of information lost during the beginning of the transient current).…”
Section: E Alternative Thermal Wave Methods (Atwm)mentioning
confidence: 99%
“…Several techniques exist [3][4][5][6][7][8][9][10][11] and are able to probe different materials [12][13][14][15][16] with various thicknesses (from a few micrometres to several millimetres). Most of them are based on the physical interaction of an external source (thermal, pressure) with the sample studied by breaking the balance 1 Author to whom correspondence should be addressed.…”
Section: Introductionmentioning
confidence: 99%