“…Methods specifically for reflection DIC have also been developed. 17,18 Recent additions to these contributions include ͑1͒ an iterative phase estimation method developed for reflection DIC, which incorporates the use of an atomic force microscope; 19 ͑2͒ a method applying noniterative deconvolution, with an approximate MTF, to phase-modulated DIC images in the weak phase regime developed for generally shaped phase objects in reflection; 20 and ͑3͒ results from a quantitative method, employing phase-shifting techniques similar to those used in the method discussed here, showing that the Abel transform can be used to numerically integrate linear phase gradients of rotationally symmetric objects with high accuracy. 21,22 Alternative approaches to quantitative phase microscopy that do not rely on DIC microscopy include quantitative phase amplitude microscopy, 23 fast Fourier phase microscopy, 24 phase-dispersion microscopy, 25 spiral phase contrast microscopy, 26 optical coherence microscopy, 27 digital holographic microscopy, 28,29 structured illumination phase microscopy, 30 and scanning transmission microscopy with a position sensitive detector.…”