A New Method to Avoid Crowding Phenomenon in Extracting the Permittivity of Ferroelectric Thin Films

Wu, Yunqiu; Tang, Zongxi; Xu, Yuehang; He, Xi

doi:10.2528/pierl08091402

Cited by 14 publications

(6 citation statements)

References 13 publications

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“…1). In these circumstances, it is convenient to use ABCD matrix [21, 38,39] or wave cascading matrix (WCM) presentations [40] of such microwave networks. For the mathematical analysis in this paper, we utilize the wave cascading matrix (WCM) since it is useful in calibration/error correction problems [22,24].…”

Section: Model For the Problemmentioning

confidence: 99%

A Microwave Method for Unique and Non-Ambiguous Permittivity Determination of Liquid Materials From Measured Uncalibrated Scattering Parameters

Hasar¹,

Şimşek²,

Zateroglu³

et al. 2009

PIER

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Abstract-A new microwave method based on calibrationindependent measurements has been proposed for non-ambiguous complex permittivity determination of liquid materials. We have derived a function in terms of the first-reflection coefficient of the sample using raw complex scattering parameter measurements of three measurement configurations. We have verified the proposed method from measurements of two liquid test samples with the available reference data in the literature.

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Section: Model For the Problemmentioning

confidence: 99%

A Microwave Method for Unique and Non-Ambiguous Permittivity Determination of Liquid Materials From Measured Uncalibrated Scattering Parameters

Hasar¹,

Şimşek²,

Zateroglu³

et al. 2009

PIER

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“…1. Instead, we could have used transmission (ABCD) matrix or wave-cascading matrix (WCM) presentations [34][35][36] to derive the same expressions for ε r and μ r in (30) and (31).…”

Section: Derivation Of Constitutive Parametersmentioning

confidence: 99%

Thickness-Independent Automated Constitutive Parameters Extraction of Thin Solid and Liquid Materials From Waveguide Measurements

Hasar¹

2009

PIER

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Abstract-The constitutive parameters measurement of thin solid and liquid materials by transmission-reflection methods generally suffers from a) the requirement of the transformation of measured scattering parameters from the reference plane to the end surfaces of the material (measurement plane) and b) inaccurate knowledge on the length of the material, if the material does not fill the entire measurement cell (a waveguide or coaxial-line section). In this research paper, a microwave waveguide method for constitutive parameters determination of these materials is proposed to simultaneously eliminate these problems. There are three main advantages of the proposed method as: a) it explicitly determines the constitutive parameters from measured S-parameters; b) it does not require the knowledge about sample length since it directly measures it as a byproduct of the method; and c) it offers a self-checking feature to trace the performance and accurateness of measurements. This feature does not depend on the constitutive parameters of the sample. We measured the complex permittivity of some thin solid and liquid test samples for validation of the method.

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“…Finally, Table 3 demonstrates the measured thickness of each specimen for different N values where k = m = 1 and ψ = 0.5. The second frequencies, which are needed for exact thickness evaluation, for each case in Tables 1-3, are computed using (20) for given ψ, N , k, and m values. The main results obtained from measurements are as follows:…”

Section: Measurementsmentioning

confidence: 99%

“…1) can conveniently be analyzed by either ABCD matrix [11,20,21] or wave cascading matrix (WCM) presentations [22] of such microwave networks. For the mathematical analysis, we will utilize the wave cascading matrix (WCM) since it is useful in calibration/error correction problems [15].…”

Section: Introductionmentioning

confidence: 99%

On the Application of Microwave Calibration-Independent Measurements for Noninvasive Thickness Evaluation of Medium- Or Low-Loss Solid Materials

Hasar¹,

Şimşek²

2009

PIER

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Abstract-Microwave methods require some sort of calibration before physical (thickness, flaw, etc.) and electrical (permittivity, permeability, etc.) measurements of materials. It is always attractive to devise a method which not only eliminates this necessity but also saves time before measurements. Microwave calibration-independent measurements can be utilized for this goal. However, in the literature, these measurements are only applied for electrical measurements of materials. In this research paper, we investigate the performance of microwave calibration-independent measurements for thickness evaluation of dielectric materials to increase the potential of available microwave techniques for thickness evaluation of dielectric materials. We derive an explicit expression for thickness estimation of dielectric materials from calibration-independent measurements for the adopted calibration-independent technique. We also propose a criterion for increasing the performance of measurements. We conducted thickness measurements of six dielectric specimens with different lengths to validate the derived expressions and the proposed criterion for thickness measurements.

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A New Method to Avoid Crowding Phenomenon in Extracting the Permittivity of Ferroelectric Thin Films

Cited by 14 publications

References 13 publications

A Microwave Method for Unique and Non-Ambiguous Permittivity Determination of Liquid Materials From Measured Uncalibrated Scattering Parameters

A Microwave Method for Unique and Non-Ambiguous Permittivity Determination of Liquid Materials From Measured Uncalibrated Scattering Parameters

Thickness-Independent Automated Constitutive Parameters Extraction of Thin Solid and Liquid Materials From Waveguide Measurements

On the Application of Microwave Calibration-Independent Measurements for Noninvasive Thickness Evaluation of Medium- Or Low-Loss Solid Materials

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