A new model for propagation of electrical tree structures in polymeric insulation

The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004.

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In the present study, various amounts of nano-and micro-scale zinc oxide particles (62 nm and 1 w average diameter) were systematically introduced into an Araldite epoxy resin matrix for reinforcement purposes. The influence of these particles on the electrical treeing breakdown resistance was investigated experimentally. Samples of point-plane geometry were made and tested under 10 kV and 15 kV AC voltage. Comparative results are presented which show that the addition of a small amount (0.5 to 1 wt.%) of zinc oxide particles in the epoxy resin can make significant improvements in breakdown resistance by increasing the treeing time to breakdown, and nano-ZnO/epoxy composites are far more resistive to treeing breakdown than that of microZnO/epoxy composites and neat epoxy resin. The possible reasons why and how smaller particles should improve the electrical treeing resistance are discussed.

Section: Hv Needle Electmdementioning

confidence: 99%

Effect of nano-fillers on electrical treeing in epoxy resin subjected to AC voltage

The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004.

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“…An attempt is now made to develop a mechanisms-based physical model to explain these observations. This is achieved by applying the authors' recent model for propagation of electrical tree shucturesinpolymericinsulation [11,12].…”

Section: Resistant Composite Dielectricsmentioning

confidence: 99%

Filler volume fraction effects on the breakdown resistance of an epoxy microcomposite dielectric

Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004.

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Studies have been made of the development of micro-composite dielectrics with electrical breakdown resistance superior to the neat epoxy resin. Micron-sized aluminium trihydroxide particles were used as reinforcements to enhance the time to breakdown of an Araldite epoxy resin. Electrical tree growth tests have been performed in point-plane specimens in unfilled resin and resin-filled with aluminium trihydroxide in the 0-15 wt % range. Results are presented which show that the addition of filler particles in the epoxy resin can make considerable improvements in breakdown resistance by increasing the times to breakdown. In particular, the times to breakdown of microcomposite dielectrics increase with the increasing filler volume fraction. A model is proposed for electrical treeing breakdown-resistant composite dielectrics which accounts well for these experimental observations.

“…The experimental results described above can be interpreted in terms of the quantitative physical model previously proposed by the authors [3,4]. In brief, the growth of electrical trees is considered to arise from the formation of an electrical damage process zone (DPZ) that precedes and surrounds the tree tip during the tree growth process, as shown in Figure 4; the mechanism of tree growth is considered to be that the submicroscopic trees initiate, grow and coalesce with the main tree channel due to submicroscopic voids created via a thermally activated process within the DPZ ahead of the tree tip [3,4]; the tree structure on a macroscopic level is modeled as a fractal cluster that is formed as a result of the successive joining of submicroscopic trees.…”

Section: Model For Electrical Tree Structure Grnwthmentioning

confidence: 94%

“…The characteristics of electrical tree growth have been found to he very sensitive to test voltage and material age [2]. The aim of this work is to investigate the effect of test voltage on the electrical tree growth morphology and breakdown characteristics of the Araldite LYMY 5052 epoxy resin system and to apply the experimental data to examine a quantitative physical model of electrical tree growth previously proposed by the authors [3,4]. The LYMY 5052 epoxy resin is one of the most important hard cast-types of resins employed in highvoltage insulation technology.…”

Section: Introductionmentioning

confidence: 99%

Electrical treeing studies on the Araldite LY/HY 5052 epoxy resin over a wide range of stressing voltage

The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004.

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Electrical treeing breakdown (a long-term electrical deterioration process) has been investigated in Araldite LYlHY 5052 epoxy resin pin-plane specimens subjected to a wide range of 50 Hz alternating current electrical stress. The full process of electrical tree initiation and growth was recorded periodically by using a digital camera. The electrical Iree growth structural characteristics were examined by means of the measurement of the fractal dimension. The voltage dependence of electrical tree growth time to brekadown was related to the voltage-dependent changes in the fractal dimension of the tree structures. The experimental results obtained in this study are described in terms of a quantitative physical model of electrical tree growth that has been previously proposed by the authors.