2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems &Amp; Eurosensors XXXIII (TRANSDUCERS &Am 2019
DOI: 10.1109/transducers.2019.8808764
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A New Simple Fabrication Method for Silicon Nanowire-Based Accelerometers

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Cited by 9 publications
(17 citation statements)
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“…The overall volume of the sensor is 360 μm × 300 μm × 40 μm, a 36% reduction in total area as compared to commercial devices. The device has 30 kHz as first resonance frequency along the sensing axis and sensitivity of 98 mV/ g ; Figure c shows the SEM image of the fabricated device . A piezoresistive cantilever and two spiral liquid channels based angular accelerometer was reported by Jo et al The cantilever is placed between the liquid channels, and when there is external angular acceleration, an inertial force is applied on the liquid which causes differential pressure on the cantilever, resulting in deformation and resistance changes of the cantilever.…”
Section: Conventional Mems Acceleration Sensorsmentioning
confidence: 96%
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“…The overall volume of the sensor is 360 μm × 300 μm × 40 μm, a 36% reduction in total area as compared to commercial devices. The device has 30 kHz as first resonance frequency along the sensing axis and sensitivity of 98 mV/ g ; Figure c shows the SEM image of the fabricated device . A piezoresistive cantilever and two spiral liquid channels based angular accelerometer was reported by Jo et al The cantilever is placed between the liquid channels, and when there is external angular acceleration, an inertial force is applied on the liquid which causes differential pressure on the cantilever, resulting in deformation and resistance changes of the cantilever.…”
Section: Conventional Mems Acceleration Sensorsmentioning
confidence: 96%
“…Copyright 2019 Springer Nature. (c) SEM image of the fabricated sensor by Kim et al Reproduced with permission from ref . Copyright 2019 IEEE.…”
Section: Conventional Mems Acceleration Sensorsmentioning
confidence: 99%
See 1 more Smart Citation
“…Originally developed for the fabrication of free-standing Si micromechanical structures within bulk Si substrates, [29][30][31][32][33][34][35] the technique was recently extended into the nanoscale. [36][37][38][39][40] Using a two-stage etching technique, NWs are obtained at the upper surface of the device layer, i.e., coplanar with the MEMS surface.…”
Section: Fabrication Techniquesmentioning
confidence: 99%
“…Si NWs with a critical dimension (CD) of 20 nm could be obtained after a 10 μm-deep etch step, thereby bridging a three-order-of-magnitude scale gap. [39,43] An array of such Si NWs fabricated within bulk Si is depicted in Figure 2a, where all features were monolithically machined from the same Si [36][37][38][39][40]47] Column (ii): Si NW fabrication in thin SOI with MEMS fabricated subsequently within a thick polySi layer. [18] Fabrication steps: a) patterning of etch mask by nanolithography, b) shallow Si etch to define NW partially in (i) and fully in (ii), c) passivation for protection against further Si etch, d) polySi growth in (ii) to fabricate MEMS device layer, e) deep Si etch for MEMS fabrication, and f ) release through BOX etching.…”
Section: Fabrication Techniquesmentioning
confidence: 99%