A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation

Venkatasubramanian, Muralidharan; Agrawal, Vishwani D.

doi:10.1109/natw.2014.20

Cited by 6 publications

(4 citation statements)

References 21 publications

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“…This subsection introduces definitions of critical terms used throughout the paper. The definitions are in accordance with the previous literature [5], [6], [19]- [21], [23]- [25], [32], [34]- [37]. All definitions are true for a test sequence…”

Section: A Definitions Of Critical Termssupporting

confidence: 60%

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Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment

et al. 2019

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Among the black-box approaches to digital circuit testing, Random testing is popular due to its simplicity and cost effectiveness. Unfortunately, available evidences suggest that Random testing is equipped with a number of redundant patterns that increase test length without significantly raising the fault coverage. An extension to Random testing is Antirandom that removes redundancy by introducing a divergent pattern with every subsequent test pattern selection. A divergent pattern is induced by maximizing the Hamming distance and Cartesian distance of every subsequent test pattern from the set of previously applied test patterns. However, an enumeration of input combinations is required for the selection of a divergent pattern. Therefore, selection of a divergent pattern from all input combinations restricts the scalability of an Antirandom test pattern generation. One of the recently considered approaches is the stacking of locally optimized short sequences to generate a complete test sequence. Locally optimized short sequences originate from randomly chosen patterns instead of divergent patterns to avoid enumeration of input space. Seeding of random patterns for short sequences affects global diversity of the generated test sequence and hence, fault coverage is compromised. Therefore, this paper firstly proposes a tree traversal search based selection of divergent patterns that eliminates the search space. Ease in divergent pattern selection is used to generate optimal short sequences for divergent patterns instead of random patterns. Consequently, Multiple Controlled Antirandom Tests (MCATs) are generated that maximize distance between locally optimal short sequences to elevate the fault coverage. Fault simulation results on both ISCAS'85 and ISCAS'89 benchmark circuits prove the scalability and effectiveness of the proposed approach. Moreover, the comparison shows that up to 12% of fault coverage is improved as a result of proposed MCAT test pattern generation. INDEX TERMS Antirandom, test pattern generation, computation reduction, multiple controlled antirandom tests.

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Section: A Definitions Of Critical Termssupporting

confidence: 60%

“…Exhaustive testing is a classical technique to test the functionality of a digital combinational logic circuit under test [1]- [6]. It generates 2 N test patterns for an N-input circuit under test.…”

Section: Introductionmentioning

confidence: 99%

Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment

et al. 2019

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“…In case of single hard to detect faults that may have just a handful of unique tests in the entire search space there have been proposed probability based algorithms where new test vectors are generated based on the input probability correlation of previously unsuccessful test vectors [3].…”

Section: Introductionmentioning

confidence: 99%

Optimal Controlled Random Tests

Mrozek

Yarmolik

2017

Computer Information Systems and Industrial Management

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Part 1: AlgorithmsInternational audienceControlled random tests, methods of their generation, main criteria used for their synthesis, such as the Hamming distance and the Euclidean distance, as well as their application to the testing of both hardware and software systems are discussed. Available evidences suggest that high computational complexity is one of the main drawbacks of these methods. Therefore we propose a technique to overcome this problem. In the paper we propose the algorithm for optimal controlled random tests generation. Both experimental and analytical investigation clearly show the high efficiency of proposed solution especially for the multi-run tests with small number of iterations. The given tests can be applied for hardware and software testing but it seems they may be particularly interesting from the perspective of the effective detection of pattern sensitive faults in RAMs

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“…Spurring from D-algorithm, FAN and PODEM, test generation has evolved over the past 50 years hitting the boundaries of quantum search algorithms and utilizing probabilistic correlations among primary inputs [4][5][6][7].…”

Section: Introductionmentioning

confidence: 99%

Horizontal diversity in test generation for high fault coverage

Alamgir¹,

A’ain²,

Paraman³

et al. 2018

Turk J Elec Eng & Comp Sci

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Determination of the most appropriate test set is critical for high fault coverage in testing of digital integrated circuits. Among black-box approaches, random testing is popular due to its simplicity and cost effectiveness. An extension to random testing is antirandom that improves fault detection by maximizing the distance of every subsequent test pattern from the set of previously applied test patterns. Antirandom testing uses total Hamming distance and total cartesian distance as distance metrics to maximize diversity in the testing sequence. However, the algorithm for the antirandom test set generation has two major issues. Firstly, there is no selection criteria defined when more than one test pattern candidates have the same maximum total Hamming distance and total cartesian distance. Secondly, determination of total Hamming distance and total Cartesian distance is computational intensive as it is a summation of individual Hamming distances and cartesian distances with all the previously selected test patterns. In this paper, two-dimensional Hamming distance is proposed to address the first issue. A novel concept of horizontal Hamming distance is introduced, which acts as a third criterion for test pattern selection. Fault simulations on ISCAS'85 and ISCAS'89 benchmark circuits have shown that employing horizontal Hamming distance improves the effectiveness of pure antirandom in terms of fault coverage. Additionally, an alternative method for total Hamming distance calculations is proposed to reduce the computational intensity. The proposed method avoids summation of individual Hamming distances by keeping track of number of 0s and 1s applied at each inputs. As a result, up to 90% of the computations are reduced.

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A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation

Cited by 6 publications

References 21 publications

Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment

Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment

Optimal Controlled Random Tests

Horizontal diversity in test generation for high fault coverage

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