2020
DOI: 10.1016/j.cie.2020.106530
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A novel algorithm for defect extraction and classification of mobile phone screen based on machine vision

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Cited by 44 publications
(19 citation statements)
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“…Melnyk and Tushnytskyy [249] proposed a PCB defect detection and classification system that implemented the K-means clustering algorithm. Li et al [250] proposed a clustering algorithm that links the regions that are close to each other to detect cluster defects composed of many small point defects. The schematic diagram of the process of connecting domains A and B in the clustering method is shown in Fig.…”
Section: Characteristicsmentioning
confidence: 99%
“…Melnyk and Tushnytskyy [249] proposed a PCB defect detection and classification system that implemented the K-means clustering algorithm. Li et al [250] proposed a clustering algorithm that links the regions that are close to each other to detect cluster defects composed of many small point defects. The schematic diagram of the process of connecting domains A and B in the clustering method is shown in Fig.…”
Section: Characteristicsmentioning
confidence: 99%
“…( g ) Lack defect of gear [ 24 ]. ( h ) light leakage defect on mobile screen [ 25 ]. ( i ) Convexity defect in aluminum foil [ 26 ].…”
Section: Figurementioning
confidence: 99%
“…Bo et al [5] detected the surface defects of tiles. Li et al [6] proposed a novel defect extraction and classification scheme for mobile phone screen based on machine vision. Zhu et al [7] presented a machine vision based method for detecting surface defects of pipe joints.…”
Section: Introductionmentioning
confidence: 99%