2019
DOI: 10.1002/mmce.21908
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A novel approach for electromagnetic inverse scattering of a two‐dimensional perfect electric conductor object

Abstract: A two-dimensional shape determination technique for a perfect electric conductor target using electromagnetic inverse scattering is presented. The proposed algorithm uses the scattered field pattern and an inverse scattering technique derived from Green's function to retrieve the geometry of an unknown target. This method uses the scattering field data over a band of observation points, which is synthesized using frequency domain "method of moment" computational technique. We have verified this algorithm with … Show more

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Cited by 1 publication
(1 citation statement)
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“…The microwave imaging technique still has urgent research issues such as poor penetration results when the signal-to-noise ratio is low, illposedness, nonlinearity, and large computational burden, as well as the parameter selection problem. To conquer the above problems, the inverse scattering problem is generally converted to an optimization problem, which can be solved by the 1) objective function method (1)(2)(3)(4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14)(15)(16)(17) or 2) neural network learning method. (8)(9)(10)(11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) The objective function is generally used to find the extreme value of the problem, e.g., to calculate the minimum error of the scattering field and the measured scattering field.…”
Section: Introductionmentioning
confidence: 99%
“…The microwave imaging technique still has urgent research issues such as poor penetration results when the signal-to-noise ratio is low, illposedness, nonlinearity, and large computational burden, as well as the parameter selection problem. To conquer the above problems, the inverse scattering problem is generally converted to an optimization problem, which can be solved by the 1) objective function method (1)(2)(3)(4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14)(15)(16)(17) or 2) neural network learning method. (8)(9)(10)(11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) The objective function is generally used to find the extreme value of the problem, e.g., to calculate the minimum error of the scattering field and the measured scattering field.…”
Section: Introductionmentioning
confidence: 99%