A novel approach for reduction of electric field stress in vacuum interrupter chamber using advanced soft computing algorithms

Internal electric field modification method based on region segmentation for vacuum interrupters

“…Asaad‐Shemshadi et al presented a new evolution‐based technique to suppress the internal electric field value for the typical VI chamber. The method achieved a prominent reduction of average electric field value [9]. In [10], the EFS of the post insulator was reduced by designing metal shields, and the finite‐element method was employed to simulate the electric field distribution.…”