2014
DOI: 10.1016/j.ultramic.2014.04.003
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A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction

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Cited by 114 publications
(65 citation statements)
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“…Therefore, the sample is electrolytically polished to achieve a sharp tip, afterward the tip is etched with picric acid for 5 min to reveal GBs. To make sure that real GBs are identified and not only effects resulting from martensite needles transmission Kikuchi diffraction (TKD) is applied in combination with the last sharpening step with focused ion beam (FIB) …”
Section: Characterization Of Boron In Steelsmentioning
confidence: 99%
See 1 more Smart Citation
“…Therefore, the sample is electrolytically polished to achieve a sharp tip, afterward the tip is etched with picric acid for 5 min to reveal GBs. To make sure that real GBs are identified and not only effects resulting from martensite needles transmission Kikuchi diffraction (TKD) is applied in combination with the last sharpening step with focused ion beam (FIB) …”
Section: Characterization Of Boron In Steelsmentioning
confidence: 99%
“…An example an APT measurement of the boron distribution along a PAGB in the steel 20MnC5B5 (ZF7B) has been shown in Figure along with the C and P distributions. The steel was water quenched from the final rolling temperature …”
Section: Characterization Of Boron In Steelsmentioning
confidence: 99%
“…[27,[70][71][72] Performing the high-temperature annealing above T g,solv in the course of the two-step heat treatment yields a NL þ b microstructure. [162][163][164] In recent years, APT has been extensively applied for the understanding of underlying phenomena occurring in intermetallic TiAl alloys such as phase formation, phase stability, elemental phase preference, and its correlation with mechanical properties. Fig.…”
Section: Microstructure and Engineering Properties Of Advanced Titanimentioning
confidence: 99%
“…Furthermore, NBD allows for identification of crystallographic phases, even on atom probe tips [35]. Babinsky et al recently demonstrated that transmission Kikuchi diffraction (TKD) can be employed to investigate grain orientations directly on AP tips [3]. This SEM-based orientation mapping technique was also recently demonstrated to show improved spatial resolution as compared to EBSD; 6-8 nm in a Ni sample [37].…”
Section: Transmission Electron Microscopymentioning
confidence: 99%