2016 Asia-Pacific Microwave Conference (APMC) 2016
DOI: 10.1109/apmc.2016.7931369
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A novel approach to co-design microwave devices with distributed switches

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Cited by 17 publications
(7 citation statements)
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“…The measurements that include microwaves were Fig. 11 Calculated V-I curves compared to pure DC measurements taken more than two years back as reported in [7]. In the second episode of pure DC measurements, unfortunately, the ASB pertaining to L 1 was found damaged.…”
Section: E the Case Of Pure DCmentioning
confidence: 99%
See 2 more Smart Citations
“…The measurements that include microwaves were Fig. 11 Calculated V-I curves compared to pure DC measurements taken more than two years back as reported in [7]. In the second episode of pure DC measurements, unfortunately, the ASB pertaining to L 1 was found damaged.…”
Section: E the Case Of Pure DCmentioning
confidence: 99%
“…Topology of the Diode Fig. 1 shows different views of a typical distributed diode to be used in shunt configuration for microwave applications [7]. On top of a high resistivity silicon (HR-Si), Boron doped P-Type substrate, phosphorus doped N + region is layered to form a N + P junction.…”
Section: The Distributed Diodementioning
confidence: 99%
See 1 more Smart Citation
“…11 Calculated V-I curves compared to pure DC measurements characteristics of the boards again without supplying microwaves. The measurements that include microwaves were taken more than two years back as reported in [7]. In the second episode of pure DC measurements, unfortunately, the ASB pertaining to L 1 was found damaged.…”
Section: E the Case Of Pure DCmentioning
confidence: 99%
“…Fig. 1 shows different views of a typical distributed diode to be used in shunt configuration for microwave applications [7]. On top of a high resistivity silicon (HR-Si), Boron doped P-Type substrate, phosphorus doped N + region is layered to form a N + P junction.…”
Section: Introductionmentioning
confidence: 99%