2019 IEEE International Reliability Physics Symposium (IRPS) 2019
DOI: 10.1109/irps.2019.8720565
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A Novel Constant E-Field Methodology for Intrinsic TDDB Lifetime Projection

Ankang Teng
1
,
Chiung–Wei Lin
2
,
Meng‐Fan Chang
3
et al.
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