A Novel Fault Diagnostic Method Based on Node-Voltage Vector Ambiguity Sets

Abstract

A novel fault diagnostic method based on nodevoltage vector ambiguity sets for analog circuits is presented in this paper. The method uses a sinusoidal stimulus instead of a dc-based stimulus. It employs steady-state node-voltage responses on observable nodes under different fault conditions to establish node-voltage vector ambiguity sets for fault diagnosis. An ellipse-based measurement solution to measure node-voltage vectors is also described. A frequency selection algorithm for a sinusoidal stimulus is introduced. A fault diagnostic example based on the node-voltage vector ambiguity sets is presented. Finally, a programming strategy to extend the method to largescale analogue circuit designs is described.

Soft‐fault diagnostic method based on locus circle of steady‐state node‐voltage vector

“…These issues have attracted the attention of many engineers [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. These issues have attracted the attention of many engineers [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18].…”

“…In a previous study [7], linear-programming concept was employed, and parameter deviations were evaluated to diagnose a soft fault on a limited number of test nodes. Literature [15] described an SSNVV-based diagnostic method for hard faults. Some studies have diagnosed soft faults on the basis of the transformation of some characteristics [20].…”

“…Soft faults can take on an infinite number of varieties and are, thus, difficult to detect in a circuit network. These issues have attracted the attention of many engineers [3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. Numerous achievements were previously attained by building state equations and evaluating the states of circuits.…”

“…Discussions have mainly focused on identifying sensitive characteristics and on enhancing decision-making methods. Literature [15] described an SSNVV-based diagnostic method for hard faults. However, the law of change of an SSNVV has not been evaluated in much of the prior work when a soft fault exists in a circuit network.…”

“…In other words, the fault feature SSNVVs of the same elements are on the same LCoSSNVV, and the fault feature SSNVVs of different elements are on different LCoSSNVVs. (6) Similar to the fault feature SSNVV numbers {4, 5,6,9,14,15,17,18,19,22,23, and 24} being on the LCoSSNVV of an intersection point, the faulty element is not easily distinguished by the fault feature SSNVV. The results are as follows ( Figure 19).…”